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List of JEOL patents

List of JEOL patents
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Patents where
Current Assignee
Name
is
JEOLJEOL
Name
Description
Patent Applicant
Current Assignee
Inventor
Patent Jurisdiction
Patent Number
Date of Patent
‌
US Patent 10020162 Beam alignment method and electron microscope

Patent 10020162 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
10020162
July 10, 2018
‌
US Patent 11131638 Calibration method and analysis device

Patent 11131638 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.

JEOL
JEOL
JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
11131638
September 28, 2021
‌
US Patent D697118 Electron microscope

Patent D697118 was granted and assigned to JEOL on January, 2014 by the United States Patent and Trademark Office.

JEOL
JEOL
JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
D697118
January 7, 2014
‌
US Patent 11133151 Transmission electron microscope and method of controlling same

Patent 11133151 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.

JEOL
JEOL
JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
11133151
September 28, 2021
‌
US Patent 9997327 Liner tube and electron microscope

Patent 9997327 was granted and assigned to JEOL on June, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
9997327
June 12, 2018
‌
US Patent 10014153 Electron microscope and method of aberration measurement

Patent 10014153 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
10014153
July 3, 2018
‌
US Patent 10014159 Detector apparatus and charged particle beam system

Patent 10014159 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
10014159
July 3, 2018
‌
US Patent 11127561 Cooling apparatus for charged particle beam device

Patent 11127561 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.

JEOL
JEOL
JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
11127561
September 21, 2021
‌
US Patent 10014152 Method of aberration correction and charged particle beam system

Patent 10014152 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
10014152
July 3, 2018
‌
US Patent 10014156 Calibration method and charged particle beam system

Patent 10014156 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.

JEOL
JEOL
United States Patent and Trademark Office
United States Patent and Trademark Office
10014156
July 3, 2018
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