Golden has been acquired by ComplyAdvantage.Read about it here ⟶

List of JEOL patents

List of JEOL patents

List of Mercer International patents

List of Santec patents

List of Hale Products, Inc. patents

List of companies in Ten Coves Capital's investment portfolio

List of companies in Peak Valley Capital's investment portfolio

Patents where

Current Assignee

Name

is

JEOL

	Name	Description	Patent Applicant	Current Assignee	Inventor	Patent Jurisdiction	Patent Number	Date of Patent
	‌ US Patent 10020162 Beam alignment method and electron microscope	Patent 10020162 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	10020162	July 10, 2018
	‌ US Patent 11131638 Calibration method and analysis device	Patent 11131638 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.	JEOL	JEOL		United States Patent and Trademark Office	11131638	September 28, 2021
	‌ US Patent D697118 Electron microscope	Patent D697118 was granted and assigned to JEOL on January, 2014 by the United States Patent and Trademark Office.	JEOL	JEOL		United States Patent and Trademark Office	D697118	January 7, 2014
	‌ US Patent 11133151 Transmission electron microscope and method of controlling same	Patent 11133151 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.	JEOL	JEOL		United States Patent and Trademark Office	11133151	September 28, 2021
	‌ US Patent 9997327 Liner tube and electron microscope	Patent 9997327 was granted and assigned to JEOL on June, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	9997327	June 12, 2018
	‌ US Patent 10014153 Electron microscope and method of aberration measurement	Patent 10014153 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	10014153	July 3, 2018
	‌ US Patent 10014159 Detector apparatus and charged particle beam system	Patent 10014159 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	10014159	July 3, 2018
	‌ US Patent 11127561 Cooling apparatus for charged particle beam device	Patent 11127561 was granted and assigned to JEOL on September, 2021 by the United States Patent and Trademark Office.	JEOL	JEOL		United States Patent and Trademark Office	11127561	September 21, 2021
	‌ US Patent 10014152 Method of aberration correction and charged particle beam system	Patent 10014152 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	10014152	July 3, 2018
	‌ US Patent 10014156 Calibration method and charged particle beam system	Patent 10014156 was granted and assigned to JEOL on July, 2018 by the United States Patent and Trademark Office.		JEOL		United States Patent and Trademark Office	10014156	July 3, 2018

10 results

0 selected

10 results

0 selected