List of Verigy patents

Patents where

Current Assignee

Name

Verigy

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7274202 Carousel device, system and method for electronic circuit tester	Patent 7274202 was granted and assigned to Verigy on September, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7274202	September 25, 2007
‌ US Patent 7712000 ATE architecture and method for DFT oriented testing	Patent 7712000 was granted and assigned to Verigy on May, 2010 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7712000	May 4, 2010
‌ US Patent 7518454 Operational amplifier selecting one of inputs, and an amplifying apparatus using the OP amplifier the verification method	Patent 7518454 was granted and assigned to Verigy on April, 2009 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7518454	April 14, 2009
‌ US Patent 7180392 Coaxial DC block	Patent 7180392 was granted and assigned to Verigy on February, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7180392	February 20, 2007
‌ US Patent 7315170 Calibration apparatus and method using pulse for frequency, phase, and delay characteristic	Patent 7315170 was granted and assigned to Verigy on January, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7315170	January 1, 2008
‌ US Patent 7339844 Memory device fail summary data reduction for improved redundancy analysis	Patent 7339844 was granted and assigned to Verigy on March, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7339844	March 4, 2008
‌ US Patent 7421360 Method and apparatus for handling a user-defined event that is generated during test of a device	Patent 7421360 was granted and assigned to Verigy on September, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7421360	September 2, 2008
‌ US Patent 8010856 Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains	Patent 8010856 was granted and assigned to Verigy on August, 2011 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	8010856	August 30, 2011
‌ US Patent 7373360 Methods and apparatus that use contextual test number factors to assign test numbers	Patent 7373360 was granted and assigned to Verigy on May, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7373360	May 13, 2008
‌ US Patent 7280934 Method for test of electronic component	Patent 7280934 was granted and assigned to Verigy on October, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7280934	October 9, 2007
‌ US Patent 7404121 Method and machine-readable media for inferring relationships between test results	Patent 7404121 was granted and assigned to Verigy on July, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7404121	July 22, 2008
‌ US Patent 7262620 Resource matrix, system, and method for operating same	Patent 7262620 was granted and assigned to Verigy on August, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7262620	August 28, 2007
‌ US Patent 7254760 Methods and apparatus for providing scan patterns to an electronic device	Patent 7254760 was granted and assigned to Verigy on August, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7254760	August 7, 2007
‌ US Patent 7184469 Systems and methods for injection of test jitter in data bit-streams	Patent 7184469 was granted and assigned to Verigy on February, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7184469	February 27, 2007
‌ US Patent 7260493 Testing a device under test by sampling its clock and data signal	Patent 7260493 was granted and assigned to Verigy on August, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7260493	August 21, 2007
‌ US Patent 7791525 Time-to-digital conversion with calibration pulse injection	Patent 7791525 was granted and assigned to Verigy on September, 2010 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7791525	September 7, 2010
‌ US Patent 7323897 Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment	Patent 7323897 was granted and assigned to Verigy on January, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7323897	January 29, 2008
‌ US Patent 7412639 System and method for testing circuitry on a wafer	Patent 7412639 was granted and assigned to Verigy on August, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7412639	August 12, 2008
‌ US Patent 7590903 Re-configurable architecture for automated test equipment	Patent 7590903 was granted and assigned to Verigy on September, 2009 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7590903	September 15, 2009
‌ US Patent 7403874 Method and system for prioritizing formatting actions of a number of data formatters	Patent 7403874 was granted and assigned to Verigy on July, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7403874	July 22, 2008
‌ US Patent 7181358 Method, apparatus and database using a map of linked data nodes for storing test numbers	Patent 7181358 was granted and assigned to Verigy on February, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7181358	February 20, 2007
‌ US Patent 7137083 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure	Patent 7137083 was granted and assigned to Verigy on November, 2006 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7137083	November 14, 2006
‌ US Patent 7519827 Provisioning and use of security tokens to enable automated test equipment	Patent 7519827 was granted and assigned to Verigy on April, 2009 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7519827	April 14, 2009
‌ US Patent 7251798 Method and apparatus for quantifying the timing error induced by crosstalk between signal paths	Patent 7251798 was granted and assigned to Verigy on July, 2007 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7251798	July 31, 2007
‌ US Patent 7355378 Source synchronous sampling	Patent 7355378 was granted and assigned to Verigy on April, 2008 by the United States Patent and Trademark Office.	Verigy	United States Patent and Trademark Office	7355378	April 8, 2008

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