List of Credence Systems patents

Patents where

Current Assignee

Name

‌

Credence Systems

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7430130 D-optimized switching converter	Patent 7430130 was granted and assigned to Credence Systems on September, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7430130	September 30, 2008
‌ US Patent 7113630 PICA system detector calibration	Patent 7113630 was granted and assigned to Credence Systems on September, 2006 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7113630	September 26, 2006
‌ US Patent 7057410 Interface structure for semiconductor integrated circuit test equipment	Patent 7057410 was granted and assigned to Credence Systems on June, 2006 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7057410	June 6, 2006
‌ US Patent 7161347 Test head for semiconductor integrated circuit tester	Patent 7161347 was granted and assigned to Credence Systems on January, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7161347	January 9, 2007
‌ US Patent 7271664 Phase locked loop circuit	Patent 7271664 was granted and assigned to Credence Systems on September, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7271664	September 18, 2007
‌ US Patent 7113886 Circuit and method for distributing events in an event stream	Patent 7113886 was granted and assigned to Credence Systems on September, 2006 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7113886	September 26, 2006
‌ US Patent 7230240 Enhanced scanning control of charged particle beam systems	Patent 7230240 was granted and assigned to Credence Systems on June, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7230240	June 12, 2007
‌ US Patent 7227580 Knife edge tracking system and method	Patent 7227580 was granted and assigned to Credence Systems on June, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7227580	June 5, 2007
‌ US Patent 7336066 Reduced pin count test method and apparatus	Patent 7336066 was granted and assigned to Credence Systems on February, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7336066	February 26, 2008
‌ US Patent 7370255 Circuit testing with ring-connected test instrument modules	Patent 7370255 was granted and assigned to Credence Systems on May, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7370255	May 6, 2008
‌ US Patent 7471753 Serializer clock synthesizer	Patent 7471753 was granted and assigned to Credence Systems on December, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7471753	December 30, 2008
‌ US Patent 7439728 System and method for test socket calibration using composite waveform	Patent 7439728 was granted and assigned to Credence Systems on October, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7439728	October 21, 2008
‌ US Patent 7296195 Bit synchronization for high-speed serial device testing	Patent 7296195 was granted and assigned to Credence Systems on November, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7296195	November 13, 2007
‌ US Patent 7400154 Apparatus and method for detecting photon emissions from transistors	Patent 7400154 was granted and assigned to Credence Systems on July, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7400154	July 15, 2008
‌ US Patent 7323862 Apparatus and method for detecting photon emissions from transistors	Patent 7323862 was granted and assigned to Credence Systems on January, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7323862	January 29, 2008
‌ US Patent 7049593 Superconducting single photon detector	Patent 7049593 was granted and assigned to Credence Systems on May, 2006 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7049593	May 23, 2006
‌ US Patent 7532014 LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers	Patent 7532014 was granted and assigned to Credence Systems on May, 2009 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7532014	May 12, 2009
‌ US Patent 7343538 Programmable multi-function module for automatic test equipment systems	Patent 7343538 was granted and assigned to Credence Systems on March, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7343538	March 11, 2008
‌ US Patent 7224828 Time resolved non-invasive diagnostics system	Patent 7224828 was granted and assigned to Credence Systems on May, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7224828	May 29, 2007
‌ US Patent 6951482 Controlled-impedance coaxial cable interconnect system	Patent 6951482 was granted and assigned to Credence Systems on October, 2005 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	6951482	October 4, 2005
‌ US Patent 7135678 Charged particle guide	Patent 7135678 was granted and assigned to Credence Systems on November, 2006 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7135678	November 14, 2006
‌ US Patent 7222280 Diagnostic process for automated test equipment	Patent 7222280 was granted and assigned to Credence Systems on May, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7222280	May 22, 2007
‌ US Patent 7414438 Clock based voltage deviation detector	Patent 7414438 was granted and assigned to Credence Systems on August, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7414438	August 19, 2008
‌ US Patent 7353126 Method of determining coherent test conditions	Patent 7353126 was granted and assigned to Credence Systems on April, 2008 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7353126	April 1, 2008
‌ US Patent 7307440 Semiconductor integrated circuit tester with interchangeable tester module	Patent 7307440 was granted and assigned to Credence Systems on December, 2007 by the United States Patent and Trademark Office.	‌ Credence Systems	United States Patent and Trademark Office	7307440	December 11, 2007

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