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US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer

Patent 11885755 was granted and assigned to Sigray, Inc. on January, 2024 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Sigray, Inc.
Sigray, Inc.
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Date Filed
April 28, 2023
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Date of Patent
January 30, 2024
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Patent Applicant
Sigray, Inc.
Sigray, Inc.
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Patent Application Number
18309021
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Patent Citations
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US Patent 7023955 X-ray fluorescence system with apertured mask for analyzing patterned surfaces
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US Patent 7095822 Near-field X-ray fluorescence microprobe
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US Patent 7119953 Phase contrast microscope for short wavelength radiation and imaging method
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US Patent 7120228 Combined X-ray reflectometer and diffractometer
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US Patent 7180979 X-ray imaging system and imaging method
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US Patent 7183547 Element-specific X-ray fluorescence microscope and method of operation
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US Patent 7187751 X-ray fluorescence spectrometer and program used therein
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US Patent 7215736 X-ray micro-tomography system optimized for high resolution, throughput, image quality
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US Patent 7218703 X-ray microscopic inspection apparatus
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US Patent 7221731 X-ray microscopic inspection apparatus
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•••
Patent Citations Received
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US Patent 12085520 Quantum-limited extreme ultraviolet coherent diffraction imaging
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Patent Inventor Names
Sylvia Jia Yun Lewis
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Ruimin Qiao
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Srivatsan Seshadri
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Wenbing Yun
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Benjamin Donald Stripe
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Janos Kirz
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11885755
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Patent Primary Examiner
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Thomas R Artman
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