List of Orbotech patents

Patents where

Current Assignee

Name

Orbotech

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 11409184 Acousto-optic deflector with multiple output beams		Orbotech	Orbotech	United States Patent and Trademark Office	11409184	August 9, 2022
‌ US Patent 11627667 High-resolution soldering	Patent 11627667 was granted and assigned to Orbotech on April, 2023 by the United States Patent and Trademark Office.	Orbotech	Orbotech	United States Patent and Trademark Office	11627667	April 11, 2023
‌ US Patent 11640559 Accuracy of classification models	Patent 11640559 was granted and assigned to Orbotech on May, 2023 by the United States Patent and Trademark Office.	Orbotech	Orbotech	United States Patent and Trademark Office	11640559	May 2, 2023
‌ US Patent 11596070 Apparatus for use in preparing a printed circuit board and photosensitive ink for in an ink jet printer		Orbotech	Orbotech	United States Patent and Trademark Office	11596070	February 28, 2023
‌ US Patent 11652008 Adaptive routing for correcting die placement errors	Patent 11652008 was granted and assigned to Orbotech on May, 2023 by the United States Patent and Trademark Office.	Orbotech	Orbotech	United States Patent and Trademark Office	11652008	May 16, 2023
‌ US Patent 6847442 Illuminator for inspecting substantially flat surfaces	Patent 6847442 was granted and assigned to Orbotech on January, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6847442	January 25, 2005
‌ US Patent 11313794 Hybrid 3D inspection system		Orbotech	Orbotech	United States Patent and Trademark Office	11313794	April 26, 2022
‌ US Patent 11464114 System producing a conductive path on a substrate	Patent 11464114 was granted and assigned to Orbotech on October, 2022 by the United States Patent and Trademark Office.	Orbotech	Orbotech	United States Patent and Trademark Office	11464114	October 4, 2022
‌ US Patent 7206443 Apparatus and methods for the inspection of objects	Patent 7206443 was granted and assigned to Orbotech on April, 2007 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7206443	April 17, 2007
‌ US Patent 7170542 System and method for providing high brightness illumination	Patent 7170542 was granted and assigned to Orbotech on January, 2007 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7170542	January 30, 2007
‌ US Patent 7177458 Reduction of false alarms in PCB inspection	Patent 7177458 was granted and assigned to Orbotech on February, 2007 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7177458	February 13, 2007
‌ US Patent 6864498 Optical inspection system employing a staring array scanner	Patent 6864498 was granted and assigned to Orbotech on March, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6864498	March 8, 2005
‌ US Patent 7078650 Micro-machining employing multiple independently focused and independently steered beams	Patent 7078650 was granted and assigned to Orbotech on July, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7078650	July 18, 2006
‌ US Patent 11271119 LIFT printing of conductive traces onto a semiconductor substrate	Patent 11271119 was granted and assigned to Orbotech on March, 2022 by the United States Patent and Trademark Office.	Orbotech	Orbotech	United States Patent and Trademark Office	11271119	March 8, 2022
‌ US Patent 11113803 Inspection of a substrate using multiple cameras	Patent 11113803 was granted and assigned to Orbotech on September, 2021 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	11113803	September 7, 2021
‌ US Patent 7064338 Two-dimensional radiation detector	Patent 7064338 was granted and assigned to Orbotech on June, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7064338	June 20, 2006
‌ US Patent RE38716 Automatic visual inspection system	Patent RE38716 was granted and assigned to Orbotech on March, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	RE38716	March 22, 2005
‌ US Patent 7058474 Multi-layer printed circuit board fabrication system and method	Patent 7058474 was granted and assigned to Orbotech on June, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7058474	June 6, 2006
‌ US Patent 6973406 Apparatus and method for electrical testing of electrical circuits	Patent 6973406 was granted and assigned to Orbotech on December, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6973406	December 6, 2005
‌ US Patent 7006212 Electrical circuit conductor inspection	Patent 7006212 was granted and assigned to Orbotech on February, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7006212	February 28, 2006
‌ US Patent 7062354 Multi-layer printed circuit board fabrication system and method	Patent 7062354 was granted and assigned to Orbotech on June, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7062354	June 13, 2006
‌ US Patent 7009163 High-sensitivity optical scanning using memory integration	Patent 7009163 was granted and assigned to Orbotech on March, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	7009163	March 7, 2006
‌ US Patent 6911620 System and method for unveiling targets embedded in a multi-layered electrical circuit	Patent 6911620 was granted and assigned to Orbotech on June, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6911620	June 28, 2005
‌ US Patent 6990227 Method for printed circuit board inspection	Patent 6990227 was granted and assigned to Orbotech on January, 2006 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6990227	January 24, 2006
‌ US Patent 6870611 Electrical circuit conductor inspection	Patent 6870611 was granted and assigned to Orbotech on March, 2005 by the United States Patent and Trademark Office.		Orbotech	United States Patent and Trademark Office	6870611	March 22, 2005

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