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List of MEMC Electronic Materials patents

Patents where

Current Assignee

Name

MEMC Electronic Materials

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 6960254 Method to monitor and control the crystal cooling or quenching rate by measuring crystal surface temperature	Patent 6960254 was granted and assigned to MEMC Electronic Materials on November, 2005 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	6960254	November 1, 2005
‌ US Patent 8192248 Semiconductor wafer polishing apparatus and method of polishing	Patent 8192248 was granted and assigned to MEMC Electronic Materials on June, 2012 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	8192248	June 5, 2012
‌ US Patent 7344594 Melter assembly and method for charging a crystal forming apparatus with molten source material	Patent 7344594 was granted and assigned to MEMC Electronic Materials on March, 2008 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7344594	March 18, 2008
‌ US Patent 7497907 Partially devitrified crucible	Patent 7497907 was granted and assigned to MEMC Electronic Materials on March, 2009 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7497907	March 3, 2009
‌ US Patent 7465351 Melter assembly and method for charging a crystal forming apparatus with molten source material	Patent 7465351 was granted and assigned to MEMC Electronic Materials on December, 2008 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7465351	December 16, 2008
‌ US Patent 7242037 Process for making non-uniform minority carrier lifetime distribution in high performance silicon power devices	Patent 7242037 was granted and assigned to MEMC Electronic Materials on July, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7242037	July 10, 2007
‌ US Patent 7462246 Modified susceptor for barrel reactor	Patent 7462246 was granted and assigned to MEMC Electronic Materials on December, 2008 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7462246	December 9, 2008
‌ US Patent 7521382 High resistivity silicon structure and a process for the preparation thereof	Patent 7521382 was granted and assigned to MEMC Electronic Materials on April, 2009 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7521382	April 21, 2009
‌ US Patent 7135351 Method for controlling of thermal donor formation in high resistivity CZ silicon	Patent 7135351 was granted and assigned to MEMC Electronic Materials on November, 2006 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7135351	November 14, 2006
‌ US Patent 7291222 Systems and methods for measuring and reducing dust in granular material	Patent 7291222 was granted and assigned to MEMC Electronic Materials on November, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7291222	November 6, 2007
‌ US Patent 7930058 Nanotopography control and optimization using feedback from warp data	Patent 7930058 was granted and assigned to MEMC Electronic Materials on April, 2011 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7930058	April 19, 2011
‌ US Patent 7291221 Electromagnetic pumping of liquid silicon in a crystal growing process	Patent 7291221 was granted and assigned to MEMC Electronic Materials on November, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7291221	November 6, 2007
‌ US Patent 7201800 Process for making silicon wafers with stabilized oxygen precipitate nucleation centers	Patent 7201800 was granted and assigned to MEMC Electronic Materials on April, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7201800	April 10, 2007
‌ US Patent 7097718 Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects	Patent 7097718 was granted and assigned to MEMC Electronic Materials on August, 2006 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7097718	August 29, 2006
‌ US Patent 7559825 Method of polishing a semiconductor wafer	Patent 7559825 was granted and assigned to MEMC Electronic Materials on July, 2009 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7559825	July 14, 2009
‌ US Patent 7125450 Process for preparing single crystal silicon using crucible rotation to control temperature gradient	Patent 7125450 was granted and assigned to MEMC Electronic Materials on October, 2006 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7125450	October 24, 2006
‌ US Patent 8220647 Low thermal mass semiconductor wafer boat	Patent 8220647 was granted and assigned to MEMC Electronic Materials on July, 2012 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	8220647	July 17, 2012
‌ US Patent 7573587 Method and device for continuously measuring silicon island elevation	Patent 7573587 was granted and assigned to MEMC Electronic Materials on August, 2009 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7573587	August 11, 2009
‌ US Patent 7223304 Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field	Patent 7223304 was granted and assigned to MEMC Electronic Materials on May, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7223304	May 29, 2007
‌ US Patent 7229693 Low defect density, ideal oxygen precipitating silicon	Patent 7229693 was granted and assigned to MEMC Electronic Materials on June, 2007 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7229693	June 12, 2007
‌ US Patent 7323421 Silicon wafer etching process and composition	Patent 7323421 was granted and assigned to MEMC Electronic Materials on January, 2008 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7323421	January 29, 2008
‌ US Patent 7132091 Single crystal silicon ingot having a high arsenic concentration	Patent 7132091 was granted and assigned to MEMC Electronic Materials on November, 2006 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7132091	November 7, 2006
‌ US Patent 7846006 Dressing a wafer polishing pad	Patent 7846006 was granted and assigned to MEMC Electronic Materials on December, 2010 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7846006	December 7, 2010
‌ US Patent 7846007 System and method for dressing a wafer polishing pad	Patent 7846007 was granted and assigned to MEMC Electronic Materials on December, 2010 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	7846007	December 7, 2010
‌ US Patent 8192822 Edge etched silicon wafers	Patent 8192822 was granted and assigned to MEMC Electronic Materials on June, 2012 by the United States Patent and Trademark Office.	MEMC Electronic Materials	United States Patent and Trademark Office	8192822	June 5, 2012

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