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US Patent 11385161 Calibration verification for optical particle analyzers

Patent 11385161 was granted and assigned to Particle Measuring Systems on July, 2022 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
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Particle Measuring Systems
Current Assignee
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Particle Measuring Systems
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11385161
Date of Patent
July 12, 2022
Patent Application Number
17290494
Date Filed
April 27, 2020
Patent Citations
‌
US Patent 10859487 Automatic power control liquid particle counter with flow and bubble detection systems
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US Patent 10908059 Slurry monitor coupling bulk size distribution and single particle detection
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US Patent 10921229 Detection scheme for particle size and concentration measurement
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US Patent 10997845 Particle detectors with remote alarm monitoring and control
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US Patent 10928293 Detecting nanoparticles on production equipment and surfaces
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US Patent 11181455 Calibration verification for optical particle analyzers
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US Patent 10197487 Systems and methods for isolating condensate in a condensation particle counter
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US Patent 10345200 Microbial air sampler integrating media plate and sample collection device
...
Patent Citations Received
‌
US Patent 12130222 Condensation particle counters and methods of use
0
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US Patent 11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions
0
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US Patent 11781965 System and method for particles measurement
Patent Primary Examiner
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Hoa Q Pham
CPC Code
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G01N 15/14
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G01N 15/1434
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G01N 15/02
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G01N 21/17
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G01N 21/47
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G01N 21/53
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G01N 2015/1486
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G01N 2015/1493
...

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.

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