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US Patent 12130222 Condensation particle counters and methods of use

Patent 12130222 was granted and assigned to Particle Measuring Systems on October, 2024 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
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Particle Measuring Systems
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Current Assignee
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Particle Measuring Systems
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
121302220
Patent Inventor Names
Edward Yates0
Cary Hertert0
Brian A. Knollenberg0
Date of Patent
October 29, 2024
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Patent Application Number
178395650
Date Filed
June 14, 2022
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Patent Citations
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US Patent 7088447 Particle counter with self-concealing aperture assembly
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US Patent 7208123 Molecular contamination monitoring system and method
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US Patent 7235214 System and method for measuring molecular analytes in a measurement fluid
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US Patent 7456960 Particle counter with improved image sensor array
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US Patent 7667839 Aerosol particle sensor with axial fan
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US Patent 7719683 Condensation particle counter
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US Patent 7746469 Method for particle size and concentration measurement
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US Patent 7796255 Optical particle sensor with exhaust-cooled optical source
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...
Patent Primary Examiner
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Jamel E Williams
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CPC Code
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G01N 15/14
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G01N 2015/1486
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G01N 15/10
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Patent abstract

Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.

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