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US Patent 11181455 Calibration verification for optical particle analyzers

Patent 11181455 was granted and assigned to Particle Measuring Systems on November, 2021 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
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Particle Measuring Systems
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Current Assignee
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Particle Measuring Systems
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
111814550
Date of Patent
November 23, 2021
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Patent Application Number
166789680
Date Filed
November 8, 2019
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Patent Citations Received
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US Patent 11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions
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US Patent 11385161 Calibration verification for optical particle analyzers
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US Patent 11927509 Particle sampling systems and methods for robotic controlled manufacturing barrier systems
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US Patent 11946852 Particle detection systems and methods for on-axis particle detection and/or differential detection
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US Patent 11540248 Mobile monitoring device for controlled contamination areas
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US Patent 11781965 System and method for particles measurement
Patent Primary Examiner
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Hoa Q Pham
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Patent abstract

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.

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