Log in
Enquire now
‌

US Patent 10928293 Detecting nanoparticles on production equipment and surfaces

Patent 10928293 was granted and assigned to Particle Measuring Systems on February, 2021 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors

Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
‌
Particle Measuring Systems
Current Assignee
‌
Particle Measuring Systems
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10928293
Date of Patent
February 23, 2021
Patent Application Number
16559074
Date Filed
September 3, 2019
Patent Citations
‌
US Patent 10345200 Microbial air sampler integrating media plate and sample collection device
‌
US Patent 10792694 Condensation apparatus
‌
US Patent 10197487 Systems and methods for isolating condensate in a condensation particle counter
‌
US Patent 10371620 Automatic power control liquid particle counter with flow and bubble detection systems
Patent Citations Received
‌
US Patent 11540248 Mobile monitoring device for controlled contamination areas
‌
US Patent 11946852 Particle detection systems and methods for on-axis particle detection and/or differential detection
0
‌
US Patent 11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions
0
‌
US Patent 12130222 Condensation particle counters and methods of use
0
‌
US Patent 10997845 Particle detectors with remote alarm monitoring and control
‌
US Patent 11250684 Particle detectors with remote alarm monitoring and control
‌
US Patent 11255760 Particle sampling systems and methods for robotic controlled manufacturing barrier systems
‌
US Patent 11268930 Triggered sampling systems and methods
...
Patent Primary Examiner
‌
Jamil Ahmed
Patent abstract

Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

Timeline

No Timeline data yet.

Further Resources

Title
Author
Link
Type
Date
No Further Resources data yet.

References

Find more entities like US Patent 10928293 Detecting nanoparticles on production equipment and surfaces

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo

Company

  • Home
  • Press & Media
  • Blog
  • Careers
  • WE'RE HIRING

Products

  • Knowledge Graph
  • Query Tool
  • Data Requests
  • Knowledge Storage
  • API
  • Pricing
  • Enterprise
  • ChatGPT Plugin

Legal

  • Terms of Service
  • Enterprise Terms of Service
  • Privacy Policy

Help

  • Help center
  • API Documentation
  • Contact Us
By using this site, you agree to our Terms of Service.