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List of Zetetic Limited patents

Patents where

Current Assignee

Name

‌

Zetetic Limited

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7495769 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry	Patent 7495769 was granted and assigned to Zetetic Limited on February, 2009 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7495769	February 24, 2009
‌ US Patent 7099014 Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry	Patent 7099014 was granted and assigned to Zetetic Limited on August, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7099014	August 29, 2006
‌ US Patent 7428058 Apparatus and method for in situ and ex situ measurements of optical system flare	Patent 7428058 was granted and assigned to Zetetic Limited on September, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7428058	September 23, 2008
‌ US Patent 7133139 Longitudinal differential interferometric confocal microscopy	Patent 7133139 was granted and assigned to Zetetic Limited on November, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7133139	November 7, 2006
‌ US Patent 7324209 Apparatus and method for ellipsometric measurements with high spatial resolution	Patent 7324209 was granted and assigned to Zetetic Limited on January, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7324209	January 29, 2008
‌ US Patent 7180604 Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces	Patent 7180604 was granted and assigned to Zetetic Limited on February, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7180604	February 20, 2007
‌ US Patent 7145663 Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces	Patent 7145663 was granted and assigned to Zetetic Limited on December, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7145663	December 5, 2006
‌ US Patent 7460245 Apparatus and method for measurement and compensation of atmospheric turbulence effects in wavefront interferometry	Patent 7460245 was granted and assigned to Zetetic Limited on December, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7460245	December 2, 2008
‌ US Patent 7405832 Apparatus and methods for reduction and compensation of effects of vibrations and of environmental effects in wavefront interferometry	Patent 7405832 was granted and assigned to Zetetic Limited on July, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7405832	July 29, 2008
‌ US Patent 7355722 Catoptric and catadioptric imaging systems with adaptive catoptric surfaces	Patent 7355722 was granted and assigned to Zetetic Limited on April, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7355722	April 8, 2008
‌ US Patent 7324216 Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers	Patent 7324216 was granted and assigned to Zetetic Limited on January, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7324216	January 29, 2008
‌ US Patent 7345771 Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks	Patent 7345771 was granted and assigned to Zetetic Limited on March, 2008 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7345771	March 18, 2008
‌ US Patent 7646490 Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase shifting point-diffraction interferometry	Patent 7646490 was granted and assigned to Zetetic Limited on January, 2010 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7646490	January 12, 2010
‌ US Patent 7164480 Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy	Patent 7164480 was granted and assigned to Zetetic Limited on January, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7164480	January 16, 2007
‌ US Patent 7298496 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry	Patent 7298496 was granted and assigned to Zetetic Limited on November, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7298496	November 20, 2007
‌ US Patent 7508527 Apparatus and method of in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry	Patent 7508527 was granted and assigned to Zetetic Limited on March, 2009 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7508527	March 24, 2009
‌ US Patent 7161680 Apparatus and method for joint and time delayed measurements of components of conjugated quadratures of fields of reflected/scattered and transmitted/scattered beams by an object in interferometry	Patent 7161680 was granted and assigned to Zetetic Limited on January, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7161680	January 9, 2007
‌ US Patent 7263259 Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities	Patent 7263259 was granted and assigned to Zetetic Limited on August, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7263259	August 28, 2007
‌ US Patent 7312877 Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy	Patent 7312877 was granted and assigned to Zetetic Limited on December, 2007 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7312877	December 25, 2007
‌ US Patent 6847029 Multiple-source arrays with optical transmission enhanced by resonant cavities	Patent 6847029 was granted and assigned to Zetetic Limited on January, 2005 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	6847029	January 25, 2005
‌ US Patent 7046372 Transverse differential interferometric confocal microscopy	Patent 7046372 was granted and assigned to Zetetic Limited on May, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7046372	May 16, 2006
‌ US Patent 7084983 Interferometric confocal microscopy incorporating a pinhole array beam-splitter	Patent 7084983 was granted and assigned to Zetetic Limited on August, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7084983	August 1, 2006
‌ US Patent 7054077 Method for constructing a catadioptric lens system	Patent 7054077 was granted and assigned to Zetetic Limited on May, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7054077	May 30, 2006
‌ US Patent 7084984 Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology	Patent 7084984 was granted and assigned to Zetetic Limited on August, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7084984	August 1, 2006
‌ US Patent 7064838 Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry	Patent 7064838 was granted and assigned to Zetetic Limited on June, 2006 by the United States Patent and Trademark Office.	‌ Zetetic Limited	United States Patent and Trademark Office	7064838	June 20, 2006

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