List of Touchdown Technologies patents

Patents where

Current Assignee

Name

‌

Touchdown Technologies

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7589547 Forked probe for testing semiconductor devices	Patent 7589547 was granted and assigned to Touchdown Technologies on September, 2009 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7589547	September 15, 2009
‌ US Patent 7264984 Process for forming MEMS	Patent 7264984 was granted and assigned to Touchdown Technologies on September, 2007 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7264984	September 4, 2007
‌ US Patent 7362119 Torsion spring probe contactor design	Patent 7362119 was granted and assigned to Touchdown Technologies on April, 2008 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7362119	April 22, 2008
‌ US Patent 7589542 Hybrid probe for testing semiconductor devices	Patent 7589542 was granted and assigned to Touchdown Technologies on September, 2009 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7589542	September 15, 2009
‌ US Patent 7791361 Planarizing probe card	Patent 7791361 was granted and assigned to Touchdown Technologies on September, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7791361	September 7, 2010
‌ US Patent 7365551 Excess overdrive detector for probe cards	Patent 7365551 was granted and assigned to Touchdown Technologies on April, 2008 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7365551	April 29, 2008
‌ US Patent 7355422 Optically enhanced probe alignment	Patent 7355422 was granted and assigned to Touchdown Technologies on April, 2008 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7355422	April 8, 2008
‌ US Patent 7365553 Probe card assembly	Patent 7365553 was granted and assigned to Touchdown Technologies on April, 2008 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7365553	April 29, 2008
‌ US Patent 7922888 Post and tip design for a probe contact	Patent 7922888 was granted and assigned to Touchdown Technologies on April, 2011 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7922888	April 12, 2011
‌ US Patent 7724010 Torsion spring probe contactor design	Patent 7724010 was granted and assigned to Touchdown Technologies on May, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7724010	May 25, 2010
‌ US Patent 7728612 Probe card assembly and method of forming same	Patent 7728612 was granted and assigned to Touchdown Technologies on June, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7728612	June 1, 2010
‌ US Patent 7759952 Method of forming probe card assembly	Patent 7759952 was granted and assigned to Touchdown Technologies on July, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7759952	July 20, 2010
‌ US Patent 7692436 Probe card substrate with bonded via	Patent 7692436 was granted and assigned to Touchdown Technologies on April, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7692436	April 6, 2010
‌ US Patent 7759951 Semiconductor testing device with elastomer interposer	Patent 7759951 was granted and assigned to Touchdown Technologies on July, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7759951	July 20, 2010
‌ US Patent 7761966 Method for repairing a microelectromechanical system	Patent 7761966 was granted and assigned to Touchdown Technologies on July, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7761966	July 27, 2010
‌ US Patent 7378734 Stacked contact bump	Patent 7378734 was granted and assigned to Touchdown Technologies on May, 2008 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7378734	May 27, 2008
‌ US Patent 7180316 Probe head with machined mounting pads and method of forming same	Patent 7180316 was granted and assigned to Touchdown Technologies on February, 2007 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7180316	February 20, 2007
‌ US Patent 7538567 Probe card with balanced lateral force	Patent 7538567 was granted and assigned to Touchdown Technologies on May, 2009 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7538567	May 26, 2009
‌ US Patent 7245135 Post and tip design for a probe contact	Patent 7245135 was granted and assigned to Touchdown Technologies on July, 2007 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7245135	July 17, 2007
‌ US Patent 7772859 Probe for testing semiconductor devices with features that increase stress tolerance	Patent 7772859 was granted and assigned to Touchdown Technologies on August, 2010 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7772859	August 10, 2010
‌ US Patent 7271022 Process for forming microstructures	Patent 7271022 was granted and assigned to Touchdown Technologies on September, 2007 by the United States Patent and Trademark Office.	‌ Touchdown Technologies	United States Patent and Trademark Office	7271022	September 18, 2007

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