List of Topcon patents

Patents where

Current Assignee

Name

Topcon

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 11490802 Ophthalmologic apparatus and method for controlling the same		Topcon	Topcon	United States Patent and Trademark Office	11490802	November 8, 2022
‌ US Patent 11547294 Ophthalmic apparatus, controlling method thereof, and recording medium	Patent 11547294 was granted and assigned to Topcon on January, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11547294	January 10, 2023
‌ US Patent 11540711 Ophthalmologic apparatus and method for controlling the same	Patent 11540711 was granted and assigned to Topcon on January, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11540711	January 3, 2023
‌ US Patent 11585900 Reflecting prism, measurement target object including reflecting prism, surveying device, coordinate comparing section, surveying method, and surveying processing program		Topcon	Topcon	United States Patent and Trademark Office	11585900	February 21, 2023
‌ US Patent 11619741 Surveying data processing device, surveying data processing method, and surveying data processing program	Patent 11619741 was granted and assigned to Topcon on April, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11619741	April 4, 2023
‌ US Patent 7860273 Device and method for position measurement	Patent 7860273 was granted and assigned to Topcon on December, 2010 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7860273	December 28, 2010
‌ US Patent 7568800 Apparatus and method for spectrally measuring fundus	Patent 7568800 was granted and assigned to Topcon on August, 2009 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7568800	August 4, 2009
‌ US Patent 11598874 Surveying instrument and surveying instrument system	Patent 11598874 was granted and assigned to Topcon on March, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11598874	March 7, 2023
‌ US Patent 7479982 Device and method of measuring data for calibration, program for measuring data for calibration, program recording medium readable with computer, and image data processing device	Patent 7479982 was granted and assigned to Topcon on January, 2009 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7479982	January 20, 2009
‌ US Patent 11497397 Ophthalmologic apparatus	Patent 11497397 was granted and assigned to Topcon on November, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11497397	November 15, 2022
‌ US Patent 11580696 Surveying data processing device, surveying data processing method, and surveying data processing program	Patent 11580696 was granted and assigned to Topcon on February, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11580696	February 14, 2023
‌ US Patent 11493611 Laser scanner	Patent 11493611 was granted and assigned to Topcon on November, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11493611	November 8, 2022
‌ US Patent 11644575 Surveying device and surveying method	Patent 11644575 was granted and assigned to Topcon on May, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11644575	May 9, 2023
‌ US Patent 7329867 Electron beam system and electron beam measuring and observing methods	Patent 7329867 was granted and assigned to Topcon on February, 2008 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7329867	February 12, 2008
‌ US Patent 7151258 Electron beam system and electron beam measuring and observing methods	Patent 7151258 was granted and assigned to Topcon on December, 2006 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7151258	December 19, 2006
‌ US Patent 11382498 Ophthalmologic apparatus and measurement method of eye	Patent 11382498 was granted and assigned to Topcon on July, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11382498	July 12, 2022
‌ US Patent 11630208 Measurement system, measurement method, and measurement program	Patent 11630208 was granted and assigned to Topcon on April, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11630208	April 18, 2023
‌ US Patent 11460299 Survey system	Patent 11460299 was granted and assigned to Topcon on October, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11460299	October 4, 2022
‌ US Patent 11307031 Surveying device, and calibration checking method and calibration checking program for surveying device	Patent 11307031 was granted and assigned to Topcon on April, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11307031	April 19, 2022
‌ US Patent 11512957 Surveying instrument		Topcon	Topcon	United States Patent and Trademark Office	11512957	November 29, 2022
‌ US Patent 11551411 Data processor, data processing method, and data processing program for determining correspondence relationships between laser scanning point clouds	Patent 11551411 was granted and assigned to Topcon on January, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11551411	January 10, 2023
‌ US Patent 7349580 Apparatus and method for calibrating zoom lens	Patent 7349580 was granted and assigned to Topcon on March, 2008 by the United States Patent and Trademark Office.		Topcon	United States Patent and Trademark Office	7349580	March 25, 2008
‌ US Patent 11629957 Surveying apparatus	Patent 11629957 was granted and assigned to Topcon on April, 2023 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11629957	April 18, 2023
‌ US Patent 11536568 Target instrument and surveying system	Patent 11536568 was granted and assigned to Topcon on December, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11536568	December 27, 2022
‌ US Patent 11291368 Ophthalmologic apparatus and method of controlling the same	Patent 11291368 was granted and assigned to Topcon on April, 2022 by the United States Patent and Trademark Office.	Topcon	Topcon	United States Patent and Trademark Office	11291368	April 5, 2022

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