List of TeraView patents

Patents where

Current Assignee

Name

TeraView

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 8027709 Radiation probe and detecting tooth decay	Patent 8027709 was granted and assigned to TeraView on September, 2011 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	8027709	September 27, 2011
‌ US Patent 7612341 Image of sample using terahertz time domain spectroscopy in reflection mode to identify in a first material like normal breast tissue a second material like cancerous tissue by evaluating the phase change at the interface between the sample and a window like a quartz window, against which the sample is pressed	Patent 7612341 was granted and assigned to TeraView on November, 2009 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7612341	November 3, 2009
‌ US Patent 11085755 Method and system for measuring coating thickness	Patent 11085755 was granted and assigned to TeraView on August, 2021 by the United States Patent and Trademark Office.	TeraView	TeraView	United States Patent and Trademark Office	11085755	August 10, 2021
‌ US Patent 8665423 Method and apparatus for investigating a non-planar sample	Patent 8665423 was granted and assigned to TeraView on March, 2014 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	8665423	March 4, 2014
‌ US Patent 7693571 Method and apparatus for terahertz imaging	Patent 7693571 was granted and assigned to TeraView on April, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7693571	April 6, 2010
‌ US Patent 11366158 Test system for testing the integrity of an electronic device		TeraView	TeraView	United States Patent and Trademark Office	11366158	June 21, 2022
‌ US Patent 7397428 Coherent THz emitter with DC power reducing resistor	Patent 7397428 was granted and assigned to TeraView on July, 2008 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7397428	July 8, 2008
‌ US Patent 10076261 Imaging apparatus and method	Patent 10076261 was granted and assigned to TeraView on September, 2018 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	10076261	September 18, 2018
‌ US Patent 7485863 Method and apparatus for investigating a sample	Patent 7485863 was granted and assigned to TeraView on February, 2009 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7485863	February 3, 2009
‌ US Patent 7728296 Spectroscopy apparatus and associated technique	Patent 7728296 was granted and assigned to TeraView on June, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7728296	June 1, 2010
‌ US Patent 7742172 Apparatus for varying the path length of a beam of radiation	Patent 7742172 was granted and assigned to TeraView on June, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7742172	June 22, 2010
‌ US Patent 9075002 TeraHertz probe array imaging system	Patent 9075002 was granted and assigned to TeraView on July, 2015 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	9075002	July 7, 2015
‌ US Patent 7675036 Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points	Patent 7675036 was granted and assigned to TeraView on March, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7675036	March 9, 2010
‌ US Patent 9829433 Imaging techniques and associated apparatus	Patent 9829433 was granted and assigned to TeraView on November, 2017 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	9829433	November 28, 2017
‌ US Patent 7663107 Method and apparatus for quantitative analysis using terahertz radiation	Patent 7663107 was granted and assigned to TeraView on February, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7663107	February 16, 2010
‌ US Patent 11169202 Test system	Patent 11169202 was granted and assigned to TeraView on November, 2021 by the United States Patent and Trademark Office.	TeraView	TeraView	United States Patent and Trademark Office	11169202	November 9, 2021
‌ US Patent 7364993 Method of enhancing the photoconductive properties of a semiconductor	Patent 7364993 was granted and assigned to TeraView on April, 2008 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7364993	April 29, 2008
‌ US Patent 10845411 Transmission line		TeraView	TeraView	United States Patent and Trademark Office	10845411	November 24, 2020
‌ US Patent 9006660 Scanning terahertz probe	Patent 9006660 was granted and assigned to TeraView on April, 2015 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	9006660	April 14, 2015
‌ US Patent 8138477 THz investigation apparatus and method	Patent 8138477 was granted and assigned to TeraView on March, 2012 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	8138477	March 20, 2012
‌ US Patent 8373126 Apparatus and method for investigating a sample	Patent 8373126 was granted and assigned to TeraView on February, 2013 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	8373126	February 12, 2013
‌ US Patent 7804069 Imaging apparatus and method	Patent 7804069 was granted and assigned to TeraView on September, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7804069	September 28, 2010
‌ US Patent 7609208 Electrodes on a photoconductive substrate for generation and detection of terahertz radiation	Patent 7609208 was granted and assigned to TeraView on October, 2009 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7609208	October 27, 2009
‌ US Patent 7777187 Apparatus and method for investigating a sample	Patent 7777187 was granted and assigned to TeraView on August, 2010 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	7777187	August 17, 2010
‌ US Patent 9201052 Analysis apparatus and method	Patent 9201052 was granted and assigned to TeraView on December, 2015 by the United States Patent and Trademark Office.		TeraView	United States Patent and Trademark Office	9201052	December 1, 2015

Results per page:

27 results

0 selected

27 results

0 selected