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List of STAr Technologies, Inc. patents

List of STAr Technologies, Inc. patents
List of ICON Aircraft patents
List of DAIMLERCHRYSLER AG patents
List of Nite Ize, Inc. patents
List of awards received by Keller Harper
List of awards received by Samir Bannout
Patents where
Current Assignee
Name
is
STAr Technologies, Inc.STAr Technologies, Inc.
Name
Description
Patent Applicant
Current Assignee
Inventor
Patent Jurisdiction
Patent Number
Date of Patent
‌
US Patent 11307246 Probing apparatus and method of operating the same

Patent 11307246 was granted and assigned to STAr Technologies, Inc. on April, 2022 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
11307246
April 19, 2022
‌
US Patent 7295023 Probe card

Patent 7295023 was granted and assigned to STAr Technologies, Inc. on November, 2007 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
7295023
November 13, 2007
‌
US Patent 7253646 Probe card with tunable stage and at least one replaceable probe

Patent 7253646 was granted and assigned to STAr Technologies, Inc. on August, 2007 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
7253646
August 7, 2007
‌
US Patent 11054465 Method of operating a probing apparatus

Patent 11054465 was granted and assigned to STAr Technologies, Inc. on July, 2021 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
11054465
July 6, 2021
‌
US Patent 10890614 Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test

Patent 10890614 was granted and assigned to STAr Technologies, Inc. on January, 2021 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
10890614
January 12, 2021
‌
US Patent 11047880 Probing device

Patent 11047880 was granted and assigned to STAr Technologies, Inc. on June, 2021 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
11047880
June 29, 2021
‌
US Patent 11754619 Probing apparatus with temperature-adjusting mechanism

Patent 11754619 was granted and assigned to STAr Technologies, Inc. on September, 2023 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
11754619
September 12, 2023
‌
US Patent 11953518 Switching matrix system and operating method thereof for semiconductor characteristic measurement

Patent 11953518 was granted and assigned to STAr Technologies, Inc. on April, 2024 by the United States Patent and Trademark Office.

STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
STAr Technologies, Inc.
United States Patent and Trademark Office
United States Patent and Trademark Office
11953518
April 9, 2024
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