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List of Sigray, Inc. patents

Patents where

Current Assignee

Name

Sigray, Inc.

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 10989822 Wavelength dispersive x-ray spectrometer	Patent 10989822 was granted and assigned to Sigray, Inc. on April, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10989822	April 27, 2021
‌ US Patent 10991538 High brightness x-ray reflection source	Patent 10991538 was granted and assigned to Sigray, Inc. on April, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10991538	April 27, 2021
‌ US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source	Patent 11686692 was granted and assigned to Sigray, Inc. on June, 2023 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11686692	June 27, 2023
‌ US Patent 11549895 System and method using x-rays for depth-resolving metrology and analysis	Patent 11549895 was granted and assigned to Sigray, Inc. on January, 2023 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11549895	January 10, 2023
‌ US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer	Patent 11885755 was granted and assigned to Sigray, Inc. on January, 2024 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11885755	January 30, 2024
‌ US Patent 10416099 Method of performing X-ray spectroscopy and X-ray absorption spectrometer system	Patent 10416099 was granted and assigned to Sigray, Inc. on September, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10416099	September 17, 2019
‌ US Patent 10962491 System and method for x-ray fluorescence with filtering	Patent 10962491 was granted and assigned to Sigray, Inc. on March, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10962491	March 30, 2021
‌ US Patent RE48612 X-ray interferometric imaging system	Patent RE48612 was granted and assigned to Sigray, Inc. on June, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	RE48612	June 29, 2021
‌ US Patent 11056308 System and method for depth-selectable x-ray analysis	Patent 11056308 was granted and assigned to Sigray, Inc. on July, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11056308	July 6, 2021
‌ US Patent 10401309 X-ray techniques using structured illumination	Patent 10401309 was granted and assigned to Sigray, Inc. on September, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10401309	September 3, 2019
‌ US Patent 10295485 X-ray transmission spectrometer system	Patent 10295485 was granted and assigned to Sigray, Inc. on May, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10295485	May 21, 2019
‌ US Patent 10352880 Method and apparatus for x-ray microscopy	Patent 10352880 was granted and assigned to Sigray, Inc. on July, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10352880	July 16, 2019
‌ US Patent 10295486 Detector for X-rays with high spatial and high spectral resolution	Patent 10295486 was granted and assigned to Sigray, Inc. on May, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10295486	May 21, 2019
‌ US Patent 10304580 Talbot X-ray microscope	Patent 10304580 was granted and assigned to Sigray, Inc. on May, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10304580	May 28, 2019
‌ US Patent 10578566 X-ray emission spectrometer system	Patent 10578566 was granted and assigned to Sigray, Inc. on March, 2020 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10578566	March 3, 2020
‌ US Patent 10297359 X-ray illumination system with multiple target microstructures	Patent 10297359 was granted and assigned to Sigray, Inc. on May, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10297359	May 21, 2019
‌ US Patent 11428651 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements		Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11428651	August 30, 2022
‌ US Patent 10976273 X-ray spectrometer system	Patent 10976273 was granted and assigned to Sigray, Inc. on April, 2021 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10976273	April 13, 2021
‌ US Patent 10349908 X-ray interferometric imaging system	Patent 10349908 was granted and assigned to Sigray, Inc. on July, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10349908	July 16, 2019
‌ US Patent 9448190 High brightness X-ray absorption spectroscopy system	Patent 9448190 was granted and assigned to Sigray, Inc. on September, 2016 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	9448190	September 20, 2016
‌ US Patent 9594036 X-ray surface analysis and measurement apparatus	Patent 9594036 was granted and assigned to Sigray, Inc. on March, 2017 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	9594036	March 14, 2017
‌ US Patent 10269528 Diverging X-ray sources using linear accumulation	Patent 10269528 was granted and assigned to Sigray, Inc. on April, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10269528	April 23, 2019
‌ US Patent 10466185 X-ray interrogation system using multiple x-ray beams	Patent 10466185 was granted and assigned to Sigray, Inc. on November, 2019 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	10466185	November 5, 2019
‌ US Patent 11215572 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements	Patent 11215572 was granted and assigned to Sigray, Inc. on January, 2022 by the United States Patent and Trademark Office.	Sigray, Inc.	Sigray, Inc.	United States Patent and Trademark Office	11215572	January 4, 2022
‌ US Patent 9570265 X-ray fluorescence system with high flux and high flux density	Patent 9570265 was granted and assigned to Sigray, Inc. on February, 2017 by the United States Patent and Trademark Office.		Sigray, Inc.	United States Patent and Trademark Office	9570265	February 14, 2017

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