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List of Particle Measuring Systems patents

Patents where

Current Assignee

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Particle Measuring Systems

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent RE39783 Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems	Patent RE39783 was granted and assigned to Particle Measuring Systems on August, 2007 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	RE39783	August 21, 2007
‌ US Patent 7667839 Aerosol particle sensor with axial fan	Patent 7667839 was granted and assigned to Particle Measuring Systems on February, 2010 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	7667839	February 23, 2010
‌ US Patent 7208123 Molecular contamination monitoring system and method	Patent 7208123 was granted and assigned to Particle Measuring Systems on April, 2007 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	7208123	April 24, 2007
‌ US Patent 11428617 Slurry monitor coupling bulk size distribution and single particle detection	Patent 11428617 was granted and assigned to Particle Measuring Systems on August, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11428617	August 30, 2022
‌ US Patent 9638665 Method for obtaining aerosol particle size distributions	Patent 9638665 was granted and assigned to Particle Measuring Systems on May, 2017 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	9638665	May 2, 2017
‌ US Patent 11385161 Calibration verification for optical particle analyzers	Patent 11385161 was granted and assigned to Particle Measuring Systems on July, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11385161	July 12, 2022
‌ US Patent 11576045 User access-restrictive systems and methods for operating particle sampling devices	Patent 11576045 was granted and assigned to Particle Measuring Systems on February, 2023 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11576045	February 7, 2023
‌ US Patent 6859277 Particle counter with strip laser diode	Patent 6859277 was granted and assigned to Particle Measuring Systems on February, 2005 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	6859277	February 22, 2005
‌ US Patent 6903818 Low noise intracavity laser particle counter	Patent 6903818 was granted and assigned to Particle Measuring Systems on June, 2005 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	6903818	June 7, 2005
‌ US Patent 7088446 Optical measurement of the chemical constituents of an opaque slurry	Patent 7088446 was granted and assigned to Particle Measuring Systems on August, 2006 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	7088446	August 8, 2006
‌ US Patent 10997845 Particle detectors with remote alarm monitoring and control	Patent 10997845 was granted and assigned to Particle Measuring Systems on May, 2021 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	10997845	May 4, 2021
‌ US Patent 10928293 Detecting nanoparticles on production equipment and surfaces	Patent 10928293 was granted and assigned to Particle Measuring Systems on February, 2021 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	10928293	February 23, 2021
‌ US Patent 7796255 Optical particle sensor with exhaust-cooled optical source	Patent 7796255 was granted and assigned to Particle Measuring Systems on September, 2010 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	7796255	September 14, 2010
‌ US Patent 11540248 Mobile monitoring device for controlled contamination areas	Patent 11540248 was granted and assigned to Particle Measuring Systems on December, 2022 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	11540248	December 27, 2022
‌ US Patent 9989462 Laser noise detection and mitigation in particle counting instruments	Patent 9989462 was granted and assigned to Particle Measuring Systems on June, 2018 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	9989462	June 5, 2018
‌ US Patent 11215546 Antimicrobial particle detectors	Patent 11215546 was granted and assigned to Particle Measuring Systems on January, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11215546	January 4, 2022
‌ US Patent 8154724 Two-dimensional optical imaging methods and systems for particle detection	Patent 8154724 was granted and assigned to Particle Measuring Systems on April, 2012 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	8154724	April 10, 2012
‌ US Patent 7456960 Particle counter with improved image sensor array	Patent 7456960 was granted and assigned to Particle Measuring Systems on November, 2008 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	7456960	November 25, 2008
‌ US Patent 11320360 Fluid refractive index optimizing particle counter	Patent 11320360 was granted and assigned to Particle Measuring Systems on May, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11320360	May 3, 2022
‌ US Patent 6945090 Method and apparatus for monitoring molecular contamination of critical surfaces using coated SAWS	Patent 6945090 was granted and assigned to Particle Measuring Systems on September, 2005 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	6945090	September 20, 2005
‌ US Patent 11428619 Detecting nanoparticles on production equipment and surfaces	Patent 11428619 was granted and assigned to Particle Measuring Systems on August, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11428619	August 30, 2022
‌ US Patent 9810558 Pressure-based airflow sensing in particle impactor systems	Patent 9810558 was granted and assigned to Particle Measuring Systems on November, 2017 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	9810558	November 7, 2017
‌ US Patent 9885640 Particle impactor with selective height adjustment	Patent 9885640 was granted and assigned to Particle Measuring Systems on February, 2018 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	9885640	February 6, 2018
‌ US Patent 11255760 Particle sampling systems and methods for robotic controlled manufacturing barrier systems	Patent 11255760 was granted and assigned to Particle Measuring Systems on February, 2022 by the United States Patent and Trademark Office.	‌ Particle Measuring Systems	‌ Particle Measuring Systems	United States Patent and Trademark Office	11255760	February 22, 2022
‌ US Patent 8427642 Two-dimensional optical imaging methods and systems for particle detection	Patent 8427642 was granted and assigned to Particle Measuring Systems on April, 2013 by the United States Patent and Trademark Office.		‌ Particle Measuring Systems	United States Patent and Trademark Office	8427642	April 23, 2013

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