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List of Hitachi High-Tech Science Corporation patents

List of Hitachi High-Tech Science Corporation patents
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Patents where
Current Assignee
Name
is
Hitachi High-Tech Science CorporationHitachi High-Tech Science Corporation
Name
Description
Patent Applicant
Current Assignee
Inventor
Patent Jurisdiction
Patent Number
Date of Patent
‌
US Patent 11600463 Cross-section observation device, and control method

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11600463
March 7, 2023
‌
US Patent 11424100 Charged particle beam irradiation apparatus and control method

Patent 11424100 was granted and assigned to Hitachi High-Tech Science Corporation on August, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11424100
August 23, 2022
‌
US Patent 11361936 Charged particle beam apparatus

Patent 11361936 was granted and assigned to Hitachi High-Tech Science Corporation on June, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11361936
June 14, 2022
‌
US Patent 11276555 Charged particle beam apparatus, composite charged particle beam apparatus, and control method for charged particle beam apparatus

Patent 11276555 was granted and assigned to Hitachi High-Tech Science Corporation on March, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11276555
March 15, 2022
‌
US Patent 11335534 Particle beam irradiation apparatus

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11335534
May 17, 2022
‌
US Patent 11340176 X-ray inspection apparatus and X-ray inspection method

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11340176
May 24, 2022
‌
US Patent 11366013 Method of obtaining quantum efficiency distribution, method of displaying quantum efficiency distribution, program for obtaining quantum efficiency distribution, program for displaying quantum efficiency distribution, fluorescence spectrophotometer, and display device

Patent 11366013 was granted and assigned to Hitachi High-Tech Science Corporation on June, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11366013
June 21, 2022
‌
US Patent 9620333 Charged particle beam apparatus

Patent 9620333 was granted and assigned to Hitachi High-Tech Science Corporation on April, 2017 by the United States Patent and Trademark Office.

Hitachi
Hitachi
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
9620333
April 11, 2017
‌
US Patent 11567047 Chromatographic data system processing apparatus

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11567047
January 31, 2023
‌
US Patent 11422118 Chromatographic data system processing apparatus

Patent 11422118 was granted and assigned to Hitachi High-Tech Science Corporation on August, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11422118
August 23, 2022
‌
US Patent 11644399 Thermal analysis apparatus

Patent 11644399 was granted and assigned to Hitachi High-Tech Science Corporation on May, 2023 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11644399
May 9, 2023
‌
US Patent 11476078 Charged particle beam apparatus

Patent 11476078 was granted and assigned to Hitachi High-Tech Science Corporation on October, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11476078
October 18, 2022
‌
US Patent 11486828 Fluorescence photometer and observation method

Patent 11486828 was granted and assigned to Hitachi High-Tech Science Corporation on November, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11486828
November 1, 2022
‌
US Patent 11422041 Thermal analysis apparatus

Patent 11422041 was granted and assigned to Hitachi High-Tech Science Corporation on August, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11422041
August 23, 2022
‌
US Patent 11282672 Charged particle beam apparatus and sample processing observation method

Patent 11282672 was granted and assigned to Hitachi High-Tech Science Corporation on March, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11282672
March 22, 2022
‌
US Patent 11598737 Analyzing apparatus and analyzing method

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11598737
March 7, 2023
‌
US Patent 9269539 Focused ion beam apparatus

Patent 9269539 was granted and assigned to Hitachi High-Tech Science Corporation on February, 2016 by the United States Patent and Trademark Office.

Hitachi
Hitachi
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
9269539
February 23, 2016
‌
US Patent 9188553 X-ray fluorescence analyzer

Patent 9188553 was granted and assigned to Hitachi High-Tech Science Corporation on November, 2015 by the United States Patent and Trademark Office.

Hitachi
Hitachi
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
9188553
November 17, 2015
‌
US Patent 11646188 Apparatus and method for analyzing evolved gas

Patent 11646188 was granted and assigned to Hitachi High-Tech Science Corporation on May, 2023 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11646188
May 9, 2023
‌
US Patent 11391755 Scanning probe microscope and setting method thereof

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11391755
July 19, 2022
‌
US Patent 11482398 Focused ion beam apparatus

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11482398
October 25, 2022
‌
US Patent 10056227 Focused ion beam apparatus

Patent 10056227 was granted and assigned to Hitachi High-Tech Science Corporation on August, 2018 by the United States Patent and Trademark Office.

Hitachi
Hitachi
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
10056227
August 21, 2018
‌
US Patent 9885639 Sample carrying device and vacuum apparatus

Patent 9885639 was granted and assigned to Hitachi High-Tech Science Corporation on February, 2018 by the United States Patent and Trademark Office.

Hitachi
Hitachi
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
9885639
February 6, 2018
‌
US Patent 11460425 Thermal analyzer

Patent 11460425 was granted and assigned to Hitachi High-Tech Science Corporation on October, 2022 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
11460425
October 4, 2022
‌
US Patent 9810648 X-ray fluorescence analyzer and X-ray fluorescence analyzing method

Patent 9810648 was granted and assigned to Hitachi High-Tech Science Corporation on November, 2017 by the United States Patent and Trademark Office.

Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
Hitachi High-Tech Science Corporation
United States Patent and Trademark Office
United States Patent and Trademark Office
9810648
November 7, 2017
...
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