List of FEI Company patents

Patents where

Current Assignee

Name

FEI Company

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 11327032 Method of examining a sample using a charged particle microscope	Patent 11327032 was granted and assigned to FEI Company on May, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11327032	May 10, 2022
‌ US Patent 7474419 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus	Patent 7474419 was granted and assigned to FEI Company on January, 2009 by the United States Patent and Trademark Office.		FEI Company	United States Patent and Trademark Office	7474419	January 6, 2009
‌ US Patent 7504182 Photolithography mask repair	Patent 7504182 was granted and assigned to FEI Company on March, 2009 by the United States Patent and Trademark Office.		FEI Company	United States Patent and Trademark Office	7504182	March 17, 2009
‌ US Patent 9711325 Charged-particle microscope providing depth-resolved imagery	Patent 9711325 was granted and assigned to FEI Company on July, 2017 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	9711325	July 18, 2017
‌ US Patent 11587759 Method, device and system for reducing off-axial aberration in electron microscopy	Patent 11587759 was granted and assigned to FEI Company on February, 2023 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11587759	February 21, 2023
‌ US Patent 11519871 Method of examining a sample using a charged particle microscope	Patent 11519871 was granted and assigned to FEI Company on December, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11519871	December 6, 2022
‌ US Patent 7474986 Defect analyzer	Patent 7474986 was granted and assigned to FEI Company on January, 2009 by the United States Patent and Trademark Office.		FEI Company	United States Patent and Trademark Office	7474986	January 6, 2009
‌ US Patent 7103505 Defect analyzer	Patent 7103505 was granted and assigned to FEI Company on September, 2006 by the United States Patent and Trademark Office.		FEI Company	United States Patent and Trademark Office	7103505	September 5, 2006
‌ US Patent 11501197 Systems and methods for quantum computing based sample analysis	Patent 11501197 was granted and assigned to FEI Company on November, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11501197	November 15, 2022
‌ US Patent 11562877 Systems and methods of clamp compensation		FEI Company	FEI Company	United States Patent and Trademark Office	11562877	January 24, 2023
‌ US Patent 11650171 Offcut angle determination using electron channeling patterns	Patent 11650171 was granted and assigned to FEI Company on May, 2023 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11650171	May 16, 2023
‌ US Patent 11605525 System and method of preparing integrated circuits for backside probing using charged particle beams		FEI Company	FEI Company	United States Patent and Trademark Office	11605525	March 14, 2023
‌ US Patent 11380529 Depth reconstruction for 3D images of samples in a charged particle system	Patent 11380529 was granted and assigned to FEI Company on July, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11380529	July 5, 2022
‌ US Patent 7423263 Planar view sample preparation	Patent 7423263 was granted and assigned to FEI Company on September, 2008 by the United States Patent and Trademark Office.		FEI Company	United States Patent and Trademark Office	7423263	September 9, 2008
‌ US Patent 11460419 Electron diffraction holography	Patent 11460419 was granted and assigned to FEI Company on October, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11460419	October 4, 2022
‌ US Patent 11499926 Method for diffraction pattern acquisition	Patent 11499926 was granted and assigned to FEI Company on November, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11499926	November 15, 2022
‌ US Patent 11282670 Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images	Patent 11282670 was granted and assigned to FEI Company on March, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11282670	March 22, 2022
‌ US Patent 9601313 Automated TEM sample preparation	Patent 9601313 was granted and assigned to FEI Company on March, 2017 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	9601313	March 21, 2017
‌ US Patent 11450505 Magnetic field free sample plane for charged particle microscope	Patent 11450505 was granted and assigned to FEI Company on September, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11450505	September 20, 2022
‌ US Patent 11313042 Dose-based end-pointing for low-kV FIB milling in TEM sample preparation		FEI Company	FEI Company	United States Patent and Trademark Office	11313042	April 26, 2022
‌ US Patent 11488800 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging	Patent 11488800 was granted and assigned to FEI Company on November, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11488800	November 1, 2022
‌ US Patent 11328895 Particle beam focusing	Patent 11328895 was granted and assigned to FEI Company on May, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11328895	May 10, 2022
‌ US Patent 11183364 Dual beam microscope system for imaging during sample processing	Patent 11183364 was granted and assigned to FEI Company on November, 2021 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11183364	November 23, 2021
‌ US Patent 11598733 Method of examining a sample using a charged particle microscope		FEI Company	FEI Company	United States Patent and Trademark Office	11598733	March 7, 2023
‌ US Patent 11508549 Particle beam profiles for analytic equipment configuration	Patent 11508549 was granted and assigned to FEI Company on November, 2022 by the United States Patent and Trademark Office.	FEI Company	FEI Company	United States Patent and Trademark Office	11508549	November 22, 2022

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