List of Celadon Systems patents

Patents where

Current Assignee

Name

‌

Celadon Systems

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 11275106 High voltage probe card system	Patent 11275106 was granted and assigned to Celadon Systems on March, 2022 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	11275106	March 15, 2022
‌ US Patent 11313902 Modular rail systems, rail systems, mechanisms, and equipment for devices under test		‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	11313902	April 26, 2022
‌ US Patent 10145863 Test systems with a probe apparatus and index mechanism	Patent 10145863 was granted and assigned to Celadon Systems on December, 2018 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	10145863	December 4, 2018
‌ US Patent 7626404 Replaceable probe apparatus for probing semiconductor wafer	Patent 7626404 was granted and assigned to Celadon Systems on December, 2009 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7626404	December 1, 2009
‌ US Patent 7148710 Probe tile for probing semiconductor wafer	Patent 7148710 was granted and assigned to Celadon Systems on December, 2006 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7148710	December 12, 2006
‌ US Patent 7545157 Shielded probe apparatus for probing semiconductor wafer	Patent 7545157 was granted and assigned to Celadon Systems on June, 2009 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7545157	June 9, 2009
‌ US Patent 10261124 Modular rail systems, rail systems, mechanisms, and equipment for devices under test	Patent 10261124 was granted and assigned to Celadon Systems on April, 2019 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	10261124	April 16, 2019
‌ US Patent 9678149 Test apparatus having a probe core with a twist lock mechanism	Patent 9678149 was granted and assigned to Celadon Systems on June, 2017 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	9678149	June 13, 2017
‌ US Patent 9018966 Test apparatus having a probe card and connector mechanism	Patent 9018966 was granted and assigned to Celadon Systems on April, 2015 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	9018966	April 28, 2015
‌ US Patent 9279829 Apparatus and method for terminating probe apparatus of semiconductor wafer	Patent 9279829 was granted and assigned to Celadon Systems on March, 2016 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	9279829	March 8, 2016
‌ US Patent 9726694 Test systems with a probe apparatus and index mechanism	Patent 9726694 was granted and assigned to Celadon Systems on August, 2017 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	9726694	August 8, 2017
‌ US Patent 8994390 Test systems with a probe apparatus and index mechanism	Patent 8994390 was granted and assigned to Celadon Systems on March, 2015 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	8994390	March 31, 2015
‌ US Patent 9910067 Apparatus and method for terminating probe apparatus of semiconductor wafer	Patent 9910067 was granted and assigned to Celadon Systems on March, 2018 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	9910067	March 6, 2018
‌ US Patent 8698515 Probe test equipment for testing a semiconductor device	Patent 8698515 was granted and assigned to Celadon Systems on April, 2014 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	8698515	April 15, 2014
‌ US Patent 7728609 Replaceable probe apparatus for probing semiconductor wafer	Patent 7728609 was granted and assigned to Celadon Systems on June, 2010 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7728609	June 1, 2010
‌ US Patent 10254309 Test apparatus having a probe core with a latch mechanism	Patent 10254309 was granted and assigned to Celadon Systems on April, 2019 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	10254309	April 9, 2019
‌ US Patent 10295565 Probe card with stress relieving feature	Patent 10295565 was granted and assigned to Celadon Systems on May, 2019 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	10295565	May 21, 2019
‌ US Patent D722031 Top contact layout board in an electrical system	Patent D722031 was granted and assigned to Celadon Systems on February, 2015 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	D722031	February 3, 2015
‌ US Patent 8149009 Apparatus and method for terminating probe apparatus of semiconductor wafer	Patent 8149009 was granted and assigned to Celadon Systems on April, 2012 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	8149009	April 3, 2012
‌ US Patent 7999564 Replaceable probe apparatus for probing semiconductor wafer	Patent 7999564 was granted and assigned to Celadon Systems on August, 2011 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7999564	August 16, 2011
‌ US Patent D713363 Support for a probe test core	Patent D713363 was granted and assigned to Celadon Systems on September, 2014 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	D713363	September 16, 2014
‌ US Patent 8674715 Test apparatus having a probe core with a twist lock mechanism	Patent 8674715 was granted and assigned to Celadon Systems on March, 2014 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	8674715	March 18, 2014
‌ US Patent 8354856 Replaceable probe apparatus for probing semiconductor wafer	Patent 8354856 was granted and assigned to Celadon Systems on January, 2013 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	8354856	January 15, 2013
‌ US Patent 7271607 Electrical, high temperature test probe with conductive driven guard	Patent 7271607 was granted and assigned to Celadon Systems on September, 2007 by the United States Patent and Trademark Office.		‌ Celadon Systems	United States Patent and Trademark Office	7271607	September 18, 2007
‌ US Patent 10976347 Magnet extension	Patent 10976347 was granted and assigned to Celadon Systems on April, 2021 by the United States Patent and Trademark Office.	‌ Celadon Systems	‌ Celadon Systems	United States Patent and Trademark Office	10976347	April 13, 2021

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