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US Patent 8680477 Non-destructive inspection method and device

Patent 8680477 was granted and assigned to IHI Corporation on March, 2014 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
IHI Corporation
IHI Corporation
Date Filed
October 8, 2010
Date of Patent
March 25, 2014
Patent Application Number
13501589
Patent Citations Received
‌
US Patent 11841335 Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target
0
Patent Inventor Names
Hajime Kuwabara
0
Hiroyuki Nose
0
Tetsuya Kobayashi
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8680477
Patent Primary Examiner
‌
Marcus Taningco

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