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US Patent 8680477 Non-destructive inspection method and device

Patent 8680477 was granted and assigned to IHI Corporation on March, 2014 by the United States Patent and Trademark Office.

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Patent
Patent

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Current Assignee
IHI Corporation
IHI Corporation
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8680477
Patent Inventor Names
Hajime Kuwabara0
Hiroyuki Nose0
Tetsuya Kobayashi0
Date of Patent
March 25, 2014
Patent Application Number
13501589
Date Filed
October 8, 2010
Patent Citations Received
‌
US Patent 11841335 Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target
0
Patent Primary Examiner
‌
Marcus Taningco
Patent abstract

A method of non-destructive inspection of a subject body including one or more elements comprises irradiating the subject body with a neutron ray along an axis line passing through a reference point; synchronously detecting gamma rays from directions inclined at equal angles to the axis line at a plurality of measurement points disposed to have equivalent intervals radially from the axis line, respectively; measuring the detected gamma rays in a plurality of energy ranges; determining whether measured values in the respective energy ranges are beyond thresholds; determining energy ranges where all the measured values are beyond the thresholds; analyzing a type of an element from the determined energy ranges; and detecting a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.

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