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US Patent 7813475 X-ray microscope with switchable x-ray source

Patent 7813475 was granted and assigned to Xradia on October, 2010 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
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Xradia
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
78134750
Patent Inventor Names
Ziyu Wu0
Andrei Tkachuk0
Michael Feser0
Peiping Zhu0
Qingxi Yuan0
Wanxia Huang0
Wenbing Yun0
Yuxin Wang0
Date of Patent
October 12, 2010
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Patent Application Number
124017400
Date Filed
March 11, 2009
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Patent Citations Received
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US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
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US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source
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US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer
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Patent Primary Examiner
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Irakli Kiknadze
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Patent abstract

An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.

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