US Patent 7653174 Inspection of small features using X-ray fluorescence
Patent 7653174 was granted and assigned to Jordan Valley Semiconductors on January, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
December 20, 2007
Date of Patent
January 26, 2010
Patent Application Number
12003215
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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