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US Patent 11913890 Screening system

Patent 11913890 was granted and assigned to HALO X RAY TECHNOLOGIES LIMITED on February, 2024 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
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HALO X RAY TECHNOLOGIES LIMITED
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Date Filed
January 6, 2022
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Date of Patent
February 27, 2024
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Patent Applicant
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HALO X RAY TECHNOLOGIES LIMITED
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Patent Application Number
18281237
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Patent Citations
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US Patent 10948432 Sample inspection apparatus employing a diffraction detector
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US Patent 7356115 Radiation scanning units including a movable platform
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US Patent 9921173 X-ray diffraction imaging system using debye ring envelopes
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US Patent 10481111 Calibration of a small angle X-ray scatterometry based metrology system
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US Patent 11703466 Sample inspection system
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Patent Inventor Names
Anthony Dicken
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Daniel Spence
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11913890
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Patent Primary Examiner
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Thomas R Artman
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