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US Patent 11913890 Screening system

Patent 11913890 was granted and assigned to HALO X RAY TECHNOLOGIES LIMITED on February, 2024 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Patent Applicant

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HALO X RAY TECHNOLOGIES LIMITED

Current Assignee

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HALO X RAY TECHNOLOGIES LIMITED

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

119138900

Patent Inventor Names

Anthony Dicken0

Daniel Spence0

Date of Patent

February 27, 2024

Patent Application Number

182812370

Date Filed

January 6, 2022

Patent Citations

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US Patent 10948432 Sample inspection apparatus employing a diffraction detector

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US Patent 7356115 Radiation scanning units including a movable platform

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US Patent 9921173 X-ray diffraction imaging system using debye ring envelopes

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US Patent 10481111 Calibration of a small angle X-ray scatterometry based metrology system

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US Patent 11703466 Sample inspection system

Patent Primary Examiner

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Thomas R Artman

Patent abstract

There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (

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