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US Patent 11752515 Coating apparatus and coating method

Patent 11752515 was granted and assigned to Tokyo Electron on September, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Tokyo Electron
Tokyo Electron
Current Assignee
Tokyo Electron
Tokyo Electron
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11752515
Patent Inventor Names
Tohru Azuma
Shinichiro Yamanaka
Naruaki Iida
Hideki Kajiwara
Yuya Yonemitsu
Kohei Kawakami
Shinichi Mizushino
Date of Patent
September 12, 2023
Patent Application Number
16897922
Date Filed
June 10, 2020
Patent Citations
‌
US Patent 7354484 Liquid processing apparatus and liquid processing method
‌
US Patent 7615117 Coating and processing apparatus and method
‌
US Patent 7758341 Utility apparatus and utility method of substrate processing apparatus
‌
US Patent 7122988 Rotation drive device and rotation drive method
‌
US Patent 7205025 Apparatus and method for drying under reduced pressure, and coating film forming apparatus
‌
US Patent 7275553 Liquid processing apparatus and liquid processing method
‌
US Patent 7337792 Liquid processing apparatus and liquid processing method
‌
US Patent 7343698 Reduced pressure drying apparatus and reduced pressure drying method
...
Patent Citations Received
‌
US Patent 11923220 Substrate processing apparatus
0
Patent Primary Examiner
‌
Jethro M. Pence

An apparatus includes substrate holders each configured to hold a substrate, a first nozzle provided for each substrate holder and for discharging a first processing liquid to the substrate at a first position, a second nozzle provided to be shared by the substrate holders and for discharging a second processing liquid to the substrate at a second position, a third nozzle provided for each substrate holder and for discharging a third processing liquid to the substrate at a third position while the first and second processing liquids are not supplied to the substrate, first to third standby parts for respectively allowing the first to third nozzles to wait outside a substrate holding region, a turning mechanism for turning the first nozzle between the first standby part and the first position, and a linear motion mechanism for linearly moving the third nozzle between the third standby part and the third position.

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