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US Patent 10269528 Diverging X-ray sources using linear accumulation

Patent 10269528 was granted and assigned to Sigray, Inc. on April, 2019 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Sigray, Inc.
Sigray, Inc.
Date Filed
May 27, 2016
Date of Patent
April 23, 2019
Patent Applicant
Sigray, Inc.
Sigray, Inc.
Patent Application Number
15166274
Patent Citations Received
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US Patent 11996259 Patterned x-ray emitting target
0
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US Patent RE48612 X-ray interferometric imaging system
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US Patent 11056308 System and method for depth-selectable x-ray analysis
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US Patent 11885753 Imaging type X-ray microscope
0
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US Patent 10653376 X-ray imaging system
‌
US Patent 10656105 Talbot-lau x-ray source and interferometric system
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US Patent 10658145 High brightness x-ray reflection source
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US Patent 10845491 Energy-resolving x-ray detection system
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US Patent 10854348 X-ray generator and x-ray analysis device
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US Patent 10962491 System and method for x-ray fluorescence with filtering
•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10269528
Patent Primary Examiner
‌
Chih-Cheng Kao

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