List of J.A. Woollam Co., Inc. patents

Patents where

Current Assignee

Name

J.A. Woollam Co., Inc.

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7633625 Spectroscopic ellipsometer and polarimeter systems	Patent 7633625 was granted and assigned to J.A. Woollam Co., Inc. on December, 2009 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7633625	December 15, 2009
‌ US Patent 11391666 Snapshot ellipsometer		J.A. Woollam Co., Inc.	United States Patent and Trademark Office	11391666	July 19, 2022
‌ US Patent 7450231 Deviation angle self compensating substantially achromatic retarder	Patent 7450231 was granted and assigned to J.A. Woollam Co., Inc. on November, 2008 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7450231	November 11, 2008
‌ US Patent 7274450 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems	Patent 7274450 was granted and assigned to J.A. Woollam Co., Inc. on September, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7274450	September 25, 2007
‌ US Patent 7907280 Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation	Patent 7907280 was granted and assigned to J.A. Woollam Co., Inc. on March, 2011 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7907280	March 15, 2011
‌ US Patent 7460230 Deviation angle self compensating substantially achromatic retarder	Patent 7460230 was granted and assigned to J.A. Woollam Co., Inc. on December, 2008 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7460230	December 2, 2008
‌ US Patent 7317529 Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples	Patent 7317529 was granted and assigned to J.A. Woollam Co., Inc. on January, 2008 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7317529	January 8, 2008
‌ US Patent 7307724 Method of reducing the effect of noise in determining the value of a dependent variable	Patent 7307724 was granted and assigned to J.A. Woollam Co., Inc. on December, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7307724	December 11, 2007
‌ US Patent 7193710 Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses	Patent 7193710 was granted and assigned to J.A. Woollam Co., Inc. on March, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7193710	March 20, 2007
‌ US Patent 7239391 Method of analysis of multiple layer samples	Patent 7239391 was granted and assigned to J.A. Woollam Co., Inc. on July, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7239391	July 3, 2007
‌ US Patent 7167241 Dielectric function of thin metal films determined by combined transmission spectroscopic ellipsometry and intensity measurements	Patent 7167241 was granted and assigned to J.A. Woollam Co., Inc. on January, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7167241	January 23, 2007
‌ US Patent 7158231 Spectroscopic ellipsometer and polarimeter systems	Patent 7158231 was granted and assigned to J.A. Woollam Co., Inc. on January, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7158231	January 2, 2007
‌ US Patent 7567345 Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample	Patent 7567345 was granted and assigned to J.A. Woollam Co., Inc. on July, 2009 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7567345	July 28, 2009
‌ US Patent 7518725 Temperature controlled lens	Patent 7518725 was granted and assigned to J.A. Woollam Co., Inc. on April, 2009 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7518725	April 14, 2009
‌ US Patent 7230699 Sample orientation system and method	Patent 7230699 was granted and assigned to J.A. Woollam Co., Inc. on June, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7230699	June 12, 2007
‌ US Patent 7872751 Fast sample height, AOI and POI alignment in mapping ellipsometer or the like	Patent 7872751 was granted and assigned to J.A. Woollam Co., Inc. on January, 2011 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7872751	January 18, 2011
‌ US Patent 7215424 Broadband ellipsometer or polarimeter system including at least one multiple element lens	Patent 7215424 was granted and assigned to J.A. Woollam Co., Inc. on May, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7215424	May 8, 2007
‌ US Patent 7253900 Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access	Patent 7253900 was granted and assigned to J.A. Woollam Co., Inc. on August, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7253900	August 7, 2007
‌ US Patent 7426030 Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems	Patent 7426030 was granted and assigned to J.A. Woollam Co., Inc. on September, 2008 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7426030	September 16, 2008
‌ US Patent 7136162 Alignment of ellipsometer beam to sample surface	Patent 7136162 was granted and assigned to J.A. Woollam Co., Inc. on November, 2006 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7136162	November 14, 2006
‌ US Patent 8436994 Fast sample height, AOI and POI alignment in mapping ellipsometer or the like	Patent 8436994 was granted and assigned to J.A. Woollam Co., Inc. on May, 2013 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	8436994	May 7, 2013
‌ US Patent 7304792 System for sequentially providing aberation corrected electromagnetic radiation to a spot on a sample at multiple angles of incidence	Patent 7304792 was granted and assigned to J.A. Woollam Co., Inc. on December, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7304792	December 4, 2007
‌ US Patent 7522279 System for and method of investigating the exact same point on a sample substrate with multiple wavelengths	Patent 7522279 was granted and assigned to J.A. Woollam Co., Inc. on April, 2009 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7522279	April 21, 2009
‌ US Patent 7215423 Control of beam spot size in ellipsometer and the like systems	Patent 7215423 was granted and assigned to J.A. Woollam Co., Inc. on May, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7215423	May 8, 2007
‌ US Patent 7193709 Ellipsometric investigation of thin films	Patent 7193709 was granted and assigned to J.A. Woollam Co., Inc. on March, 2007 by the United States Patent and Trademark Office.	J.A. Woollam Co., Inc.	United States Patent and Trademark Office	7193709	March 20, 2007

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