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US Patent 9157845 2-D MEMS tribometer with comb drives

Patent 9157845 was granted and assigned to Hysitron, Inc. on October, 2015 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
‌
Hysitron, Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9157845
Date of Patent
October 13, 2015
Patent Application Number
13099113
Date Filed
May 2, 2011
Patent Citations Received
‌
US Patent 12027343 Real-time direct measurement of mechanical properties in-situ of scanning beam microscope
0
Patent Primary Examiner
‌
Daniel S Larkin
Patent abstract

A microelectromechanical (MEMS) nanoindenter transducer including a body, a probe coupled to and moveable relative to the body, the probe holding a removeable indenter tip, a first micromachined comb drive and a second micromachined comb drive. The first micromachined comb drive includes an actuator comprising a plurality of electrostatic capacitive actuators configured to drive the probe along a first axis, including in an indentation direction, in response to an applied bias voltage, and a displacement sensor comprising a plurality of differential capacitive sensors having capacitance levels which together are representative of a position of the probe relative to the first axis. The second micromachined comb drive includes an actuator comprising a plurality of electrostatic capacitive actuators configured to drive the probe along a second axis, which is perpendicular to the first axis, in response to an applied bias voltage, and a displacement sensor comprising a plurality of differential capacitive sensors having capacitance levels which together are representative of a position of the probe relative to the second axis. Each of the electrostatic capacitive actuators and the differential capacitive sensors comprises an electrode comb pair, each electrode comb pair including a fixed electrode comb coupled to the body and a moveable electrode comb coupled to the probe.

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