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US Patent 8637383 Strain relaxation using metal materials and related structures

Patent 8637383 was granted and assigned to Soitec on January, 2014 by the United States Patent and Trademark Office.

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Patent
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Patent attributes

Current Assignee
Soitec
Soitec
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
86373830
Patent Inventor Names
Christiaan J. Werkhoven0
Date of Patent
January 28, 2014
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Patent Application Number
129779990
Date Filed
December 23, 2010
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Patent Citations Received
‌
US Patent 11830763 Methods of manufacturing thin film transistor, biometric device, and display apparatus
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Patent Primary Examiner
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Thinh T Nguyen
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Patent abstract

Methods of fabricating semiconductor structures include forming a plurality of openings extending through a semiconductor material and at least partially through a metal material and deforming the metal material to relax a remaining portion of the semiconductor material. The metal material may be deformed by exposing the metal material to a temperature sufficient to alter (i.e., increase) its ductility. The metal material may be formed from one or more of hafnium, zirconium, yttrium, and a metallic glass. Another semiconductor material may be deposited over the remaining portions of the semiconductor material, and a portion of the metal material may be removed from between each of the remaining portions of the semiconductor material. Semiconductor structures may be formed using such methods.

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