Patent attributes
Methods, data structures, and systems for classifying particles are provided. In particular, the methods and systems are configured to acquire a first set of data corresponding to measurable parameters of a microparticle and identify a location of a look-up table to which the first set of data corresponds, wherein the look-up table is framed by values associated with at least one of the measurable parameters. Furthermore, the methods and systems are configured to determine whether the first set of data fits one or more predefined algorithms respectively indicative of a different microparticle classification associated with the identified location of the look-up table. The methods and systems are further configured to classifying the microparticle within at least one predefined categorization based upon the determination of whether the first set of data fits the one or more predefined algorithms.
