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US Patent 7427867 Method and system for non-destructive evaluation of conducting structures

Patent 7427867 was granted and assigned to Intelligent Automation, Inc. on September, 2008 by the United States Patent and Trademark Office.

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Patent
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Current Assignee
Intelligent Automation, Inc.
Intelligent Automation, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
74278670
Patent Inventor Names
Eric van Doom0
Leonard S. Haynes0
Date of Patent
September 23, 2008
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Patent Application Number
118042520
Date Filed
May 17, 2007
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Patent Primary Examiner
Andrew H. Hirshfeld
Andrew H. Hirshfeld
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Patent abstract

Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes in the electrical impulse response and to locate any defects along the conducting structure.

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