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US Patent 7395727 Strain detection for automated nano-manipulation

Patent 7395727 was granted and assigned to Omniprobe on July, 2008 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
Omniprobe
Omniprobe
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7395727
Patent Inventor Names
Thomas M. Moore0
Date of Patent
July 8, 2008
Patent Application Number
11186072
Date Filed
July 21, 2005
Patent Primary Examiner
‌
Edward Lefkowitz
Patent abstract

A strain detector for in-situ lift-out, comprises a nano-manipulator probe shaft; a strain gauge mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section. There is a second cut-out on the probe shaft; the second cut-out having a semicircular cross-section. The second cut-out is positioned on the shaft opposite from the first cut-out; the first and second cut-out, thus defining a thinned region in the probe. The strain gauge is mounted on the probe shaft at the location of the thinned region. There is detecting circuitry for detecting, amplifying and conditioning the output of the strain gauge; and, wires electrically connecting the strain gauge to the detection circuitry. The wires are preferably located in a trench in the probe shaft. Other embodiments are disclosed having multiple strain gauges and detectors.

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