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US Patent 12084288 Conveyance abnormality prediction system

Patent 12084288 was granted and assigned to Ebara Corporation on September, 2024 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Ebara Corporation
Ebara Corporation
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Current Assignee
Ebara Corporation
Ebara Corporation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
120842880
Patent Inventor Names
Akira Nakamura0
Date of Patent
September 10, 2024
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Patent Application Number
177653740
Date Filed
September 18, 2020
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Patent Citations
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US Patent 8225683 Wafer bow metrology arrangements and methods thereof
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US Patent 9442482 System and method for monitoring wafer handling and a wafer handling machine
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US Patent 10714364 Apparatus and method for inspecting wafer carriers
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US Patent 10802475 Positioner for a robotic workcell
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US Patent 11328947 Aligner apparatus and alignment method
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US Patent 6925356 Method and apparatus for aligning a cassette
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US Patent 7486878 Offset correction methods and arrangement for positioning and inspecting substrates
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US Patent 7490010 Data collection method, substrate processing apparatus, and substrate processing system
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Patent Primary Examiner
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Douglas A. Hess
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CPC Code
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B65G 2203/0275
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B65G 2203/044
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H05K 13/02
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B65G 43/02
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Patent abstract

A conveyance abnormality prediction system includes an estimation unit that has a learned model having machine learned a relationship between a data set including sensor data outputted, at a time of substrate transport in the past, from each of a plurality of sensors provided on a substrate transport unit and a degree of conveyance abnormality at the time of the substrate transport, estimates a degree of conveyance abnormality at a time of new substrate transport by using, as an input, a data set including sensor data outputted from each of the plurality of sensors at the time of the new substrate transport, and outputs the estimated degree of conveyance abnormality.

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