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US Patent 11672499 X-ray imaging apparatus and method of X-ray image analysis

Patent 11672499 was granted and assigned to Shimadzu Corp. on June, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
Shimadzu Corp.
Shimadzu Corp.
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Current Assignee
Shimadzu Corp.
Shimadzu Corp.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116724990
Date of Patent
June 13, 2023
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Patent Application Number
158743890
Date Filed
January 18, 2018
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Patent Citations
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US Patent 7415169 Medical viewing system and method for enhancing structures in noisy images
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US Patent 7991453 Medical viewing system and method for detecting boundary structures
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US Patent 8594271 X-ray diagnosis apparatus and image processing apparatus
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US Patent 9230323 X-ray diagnostic apparatus and X-ray diagnostic method
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US Patent 9532754 X-ray diagnosis apparatus and image processing apparatus
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US Patent 10980498 Radiography apparatus
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Patent Citations Received
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US Patent 11928816 Image processing method, apparatus, and system, electronic device, and storage medium
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Patent Primary Examiner
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Patricia J Park
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CPC Code
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A61B 6/5205
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A61B 6/4233
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A61B 5/4848
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A61B 6/40
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A61B 6/4411
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A61B 6/504
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G06T 7/0012
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G06T 7/20
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...

An X-ray imaging apparatus includes an X-ray irradiation element, an X-ray detection element, an X-ray image generation element, and an image processing analysis element. The image processing analysis element reflects the analysis point on each frame based on a respective relative location between a characteristic point

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