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US Patent 11630064 Sample observation device and sample observation method

Patent 11630064 was granted and assigned to Hamamatsu Photonics on April, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Applicant
Hamamatsu Photonics
Hamamatsu Photonics
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Current Assignee
Hamamatsu Photonics
Hamamatsu Photonics
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116300640
Patent Inventor Names
Satoshi Yamamoto0
Masanori Matsubara0
Norikazu Sugiyama0
Date of Patent
April 18, 2023
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Patent Application Number
174886590
Date Filed
September 29, 2021
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Patent Citations
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US Patent 10145795 Light detection apparatus
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Patent Primary Examiner
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Michael P Stafira
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CPC Code
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G01N 33/02
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G01N 33/15
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G01N 33/22
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G01N 33/4833
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G01N 33/4905
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G01N 33/5076
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G01N 33/5438
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G01N 33/561
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A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

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