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US Patent 11435394 Accelerated measurements through adaptive test parameter selection

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11435394
Date of Patent
September 6, 2022
Patent Application Number
15419733
Date Filed
January 30, 2017
Patent Citations
‌
US Patent 10006952 System and method for reducing the effects of spurs on measurements using averaging with specific null selection
‌
US Patent 10116432 Real-time phase synchronization of a remote receiver with a measuring instrument
‌
US Patent 10003453 Phase synchronization of measuring instruments using free space transmission
‌
US Patent 10064317 High isolation shield gasket and method of providing a high isolation shield gasket
Patent Primary Examiner
‌
Steven L Yeninas
CPC Code
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G01R 23/18
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G01N 21/00
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G01N 22/00
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G06F 13/00
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G01R 23/16

A method for measuring electrical response of a DUT includes using a measurement instrument, generating a radio frequency (RF) test signal via the measurement instrument at one or more initial frequencies, propagating the RF test signal at the one or more initial frequencies to the DUT, measuring a response of the DUT at the one or more initial frequencies and aggregating the measured response of the DUT at the one or more initial frequencies as response measurement data. The method then includes iteratively performing, until characterization of the DUT achieves a minimum criterion, the steps of adaptively selecting an additional frequency at which to generate a RF test signal based on the response measurement data based on a predetermined adaptive frequency algorithm, generating the RF test signal at the adaptively selected additional frequency, measuring a response of the DUT at the adaptively selected additional frequency, and adding the measured response of the DUT at the adaptively selected additional frequency to the response measurement data.

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