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US Patent 11340165 Sample observation device and sample observation method

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Hamamatsu Photonics
Hamamatsu Photonics
Current Assignee
Hamamatsu Photonics
Hamamatsu Photonics
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11340165
Date of Patent
May 24, 2022
Patent Application Number
16629326
Date Filed
April 10, 2018
Patent Primary Examiner
‌
Mark R Gaworecki
CPC Code
‌
G01N 1/312
‌
G01N 15/1463
‌
G01N 2001/1006
‌
G01N 2001/302
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G01N 2015/1006
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G01N 2021/1738
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G01N 2021/6419
‌
G01N 2021/6439
...

A sample observation device includes an imaging unit that images observation light generated due to irradiation with the planar light that is transmitted through a membrane filter and outputs fluorescent light image data, a partial image generation unit that specifies a first area corresponding to a first sample holding space and a second area corresponding to a second sample holding space in the fluorescent light image data, and generates first partial image data corresponding to the first area and second partial image data corresponding to the second area, an observation image generation unit that generates first observation image data and second observation image data on the basis of the partial image data, and an analysis unit that analyzes a sample on the basis of the first observation image data and the second observation image data.

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