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US Patent 10417524 Deep active learning method for civil infrastructure defect detection

Patent 10417524 was granted and assigned to Mitsubishi Electric Research Laboratories on September, 2019 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Mitsubishi Electric Research Laboratories
Mitsubishi Electric Research Laboratories
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Current Assignee
Mitsubishi Electric Research Laboratories
Mitsubishi Electric Research Laboratories
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
104175240
Patent Inventor Names
Teng-Yok Lee0
Chen Feng0
Chieh-Chi Kao0
Ming-Yu Liu0
Date of Patent
September 17, 2019
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Patent Application Number
156465630
Date Filed
July 11, 2017
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Patent Citations Received
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US Patent 11538146 Automated machine vision-based defect detection
Patent Primary Examiner
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Ming Y Hon
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Patent abstract

An image processing system includes a memory to store a classifier and a set of labeled images for training the classifier, wherein each labeled image is labeled as either a positive image that includes an object of a specific type or a negative image that does not include the object of the specific type, wherein the set of labeled images has a first ratio of the positive images to the negative images. The system includes an input interface to receive a set of input images, a processor to determine a second ratio of the positive images, to classify the input images into positive and negative images to produce a set of classified images, and to select a subset of the classified images having the second ratio of the positive images to the negative images, and an output interface to render the subset of the input images for labeling.

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