List of Park Systems patents

List of Park Systems patents

List of Visterra Inc. patents

List of DuPont patents

List of TDK patents

Companies in the D2C industry

List of funding rounds for Ursa Space Systems

Patents where

Current Assignee

Name

is

Park Systems

	Name	Description	Patent Applicant	Current Assignee	Inventor	Patent Jurisdiction	Patent Number	Date of Patent
	‌ US Patent 11619649 Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same	Patent 11619649 was granted and assigned to Park Systems on April, 2023 by the United States Patent and Trademark Office.	Park Systems	Park Systems		United States Patent and Trademark Office	11619649	April 4, 2023
	‌ US Patent 7514679 Scanning probe microscope for measuring angle and method of measuring a sample using the same	Patent 7514679 was granted and assigned to Park Systems on April, 2009 by the United States Patent and Trademark Office.		Park Systems		United States Patent and Trademark Office	7514679	April 7, 2009
	‌ US Patent 8209766 Scanning probe microscope capable of measuring samples having overhang structure	Patent 8209766 was granted and assigned to Park Systems on June, 2012 by the United States Patent and Trademark Office.		Park Systems		United States Patent and Trademark Office	8209766	June 26, 2012
	‌ US Patent 8402560 Scanning probe microscope with drift compensation	Patent 8402560 was granted and assigned to Park Systems on March, 2013 by the United States Patent and Trademark Office.		Park Systems		United States Patent and Trademark Office	8402560	March 19, 2013
	‌ US Patent 7709791 Scanning probe microscope with automatic probe replacement function	Patent 7709791 was granted and assigned to Park Systems on May, 2010 by the United States Patent and Trademark Office.		Park Systems		United States Patent and Trademark Office	7709791	May 4, 2010
	‌ US Patent 8099793 Scanning probe microscope with automatic probe replacement function	Patent 8099793 was granted and assigned to Park Systems on January, 2012 by the United States Patent and Trademark Office.		Park Systems		United States Patent and Trademark Office	8099793	January 17, 2012
	‌ US Patent 11761981 Method and apparatus for identifying sample position in atomic force microscope	Patent 11761981 was granted and assigned to Park Systems on September, 2023 by the United States Patent and Trademark Office.	Park Systems	Park Systems		United States Patent and Trademark Office	11761981	September 19, 2023
	‌ US Patent 11598788 Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source	Patent 11598788 was granted and assigned to Park Systems on March, 2023 by the United States Patent and Trademark Office.	Park Systems	Park Systems		United States Patent and Trademark Office	11598788	March 7, 2023

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