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US Patent 9899515 Fabrication of a pair of vertical fin field effect transistors having a merged top source/drain

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
98995150
Patent Inventor Names
Chen Zhang0
Kangguo Cheng0
Wenyu Xu0
Xin Miao0
Date of Patent
February 20, 2018
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Patent Application Number
153390720
Date Filed
October 31, 2016
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Patent Citations Received
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US Patent 11854803 Gate spacer patterning
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US Patent 12069874 Methods of manufacturing a field effect transistor using carbon nanotubes and field effect transistors
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US Patent 11908923 Low-resistance top contact on VTFET
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US Patent 11659721 Methods of manufacturing a field effect transistor using carbon nanotubes and field effect transistors
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US Patent 11915933 Manufacturing method of semiconductor structure
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US Patent 11978783 Vertical fin field effect transistor devices with reduced top source/drain variability and lower resistance
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Patent Primary Examiner
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Duy T Nguyen
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Patent abstract

A method of fabricating a vertical fin field effect transistor with a merged top source/drain, including, forming a source/drain layer at the surface of a substrate, forming a plurality of vertical fins on the source/drain layer; forming protective spacers on each of the plurality of vertical fins, forming a sacrificial plug between two protective spacers, forming a filler layer on the protective spacers not in contact with the sacrificial plug, and selectively removing the sacrificial plug to form an isolation region trench between the two protective spacers.

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