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US Patent 9443757 Semiconductor device and method for fabricating the same

Patent 9443757 was granted and assigned to United Microelectronics Corporation on September, 2016 by the United States Patent and Trademark Office.

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Current Assignee
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9443757
Date of Patent
September 13, 2016
Patent Application Number
14940120
Date Filed
November 12, 2015
Patent Citations Received
‌
US Patent 12107165 Semiconductor device structure with cap layer
0
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US Patent 11757020 Semiconductor device and method
‌
US Patent 11776857 Semiconductor device
Patent Primary Examiner
‌
Mark Prenty
Patent abstract

A method for fabricating semiconductor device is disclosed. The method includes the steps of: providing a substrate having a fin-shaped structure thereon; forming an epitaxial layer on the fin-shaped structure; forming a first contact etch stop layer (CESL) on the epitaxial layer; forming a source/drain region in the epitaxial layer; and forming a second CESL on the first CESL.

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