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US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control

Patent 8809780 was granted and assigned to Sciaky, Inc. on August, 2014 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Sciaky, Inc.
Sciaky, Inc.
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Date Filed
November 13, 2013
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Date of Patent
August 19, 2014
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Patent Applicant
Sciaky, Inc.
Sciaky, Inc.
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Patent Application Number
14078910
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Patent Citations Received
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US Patent 12122120 Additive manufacturing processes and additively manufactured products
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US Patent 11858042 Open loop parameter optimization for additive manufacturing
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US Patent 11860601 Calibration of a computer-numerically-controlled machine
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US Patent 11860606 Fabrication with image tracing
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US Patent 11880182 Safety and reliability for laser fabrication
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US Patent 11995159 Multi-function computer numerically controlled machine
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US Patent 11770906 3D-printed ceramics with conductor infusion for ultra-high-speed electronics
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US Patent 11835936 Multi-user computer-numerically-controlled machine
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Patent Inventor Names
Phillip E. Wollenhaupt
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Scott Stecker
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
8809780
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Patent Primary Examiner
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Jack Berman
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