US Patent 8122185 Systems and methods for measuring the useful life of solid-state storage devices

A non-volatile solid-state storage subsystem, such as a non-volatile memory device, maintains usage statistics reflective of the wear state, and thus the remaining useful life, of the subsystem's memory array. A host system reads the usage statistics information, or data derived therefrom, from the subsystem to evaluate the subsystem's remaining life expectancy. The host system may use this information for various purposes, such as to (a) display or report information regarding the remaining life of the subsystem; (b) adjust the frequency with which data is written to the subsystem; and/or (c) select the type(s) of data written to the subsystem.