Patent attributes
The magnification Mref for a line scan camera can be found by exploiting a difference in the way Mref affects the notion of ‘focus’ in the x and y directions. Mref enters into the calculations for selecting z while focusing in the y direction, but not in x. A thin opaque calibration target is provided at a convenient height in z called the reference plane, and has straight edges aligned parallel to the x and y directions. To find Mref the line scan camera forms images of the calibration target over a range of trial z values known to include the height of the calibration target. An arbitrary and possibly incorrect trial value Mi of Mref is then assumed and many slices of the calibrations target are calculated. Within these slices the edge parallel to the x direction will be sharply defined for some zx, while at some other zy the edge parallel to the y direction will be sharply defined. Make a note of ei=zy. Repeat these steps for some number different trial Mi that cover the plausible range of Mref. Now fit a curve (e.g., a quadratic) to the data set {(ei, Mi)}, and find the y-intercept (where e=0). The associated value of M is the magnification Mref in the reference plane containing the calibration target, and we found it without knowing the actual length of any part of the calibration target.
