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US Patent 7186969 Optical configuration for imaging-type optical encoders

Patent 7186969 was granted and assigned to Mitutoyo on March, 2007 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
Mitutoyo
Mitutoyo
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
71869690
Patent Inventor Names
Joseph Daniel Tobiason0
Eric Herbert Altendorf0
Miyako Mizutani0
Shingo Nihommori0
Toshitaka Shimomura0
Date of Patent
March 6, 2007
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Patent Application Number
108046360
Date Filed
March 19, 2004
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Patent Citations Received
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US Patent 11906698 Broadband achromatic flat optical components by dispersion-engineered dielectric metasurfaces
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US Patent 11874144 Displacement measurement system
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US Patent 11978752 Aperture-metasurface and hybrid refractive-metasurface imaging systems
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US Patent 11988844 Transmissive metasurface lens integration
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US Patent 11927769 Polarization sorting metasurface microlens array device
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Patent Primary Examiner
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Stephone B. Allen
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Patent abstract

A displacement measuring device including a scale, and an optical readhead including an index pattern and a light receiving element is provided. A bright/dark pattern arising from a scale grating is detected by the readhead to measure displacement. In various embodiments, a magnification of the pattern is adjusted by the spacing between at least a lens element, aperture element, and detection plane of the readhead. An aperture can be designed to provide a diffraction-limited telecentric imaging configuration that filters an image of the scale grating to provide a sinusoidal intensity pattern that supports highly interpolated measurements. An aperture dimension, selected in relation to the grating pitch and other parameters, can provide a desirable combination of readhead operating characteristics including one or more of a desired depth of field; degree of spatial filtering; and optical signal power.

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