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US Patent 12123155 Apparatus and method of monitoring product placement within a shopping facility

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
121231550
Patent Inventor Names
Donald R. High0
Robert C. Taylor0
Shuvro Chakrobartty0
Date of Patent
October 22, 2024
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Patent Application Number
182261320
Date Filed
July 25, 2023
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Patent Citations
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US Patent 9663296 Mobile drive unit charging
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US Patent 10435279 Shopping space route guidance systems, devices and methods
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US Patent 10466092 Sensor data processing system
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US Patent 10486951 Trash can monitoring systems and methods
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US Patent 10508010 Shopping facility discarded item sorting systems, devices and methods
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US Patent 10570000 Shopping facility assistance object detection systems, devices and methods
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US Patent 10597270 Shopping facility track system and method of routing motorized transport units
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US Patent 10611614 Shopping facility assistance systems, devices and methods to drive movable item containers
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...
Patent Primary Examiner
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Talia F Crawley
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CPC Code
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G06Q 50/30
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G06Q 30/0641
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G06Q 10/02
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G06Q 30/0635
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G06Q 10/087
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G06Q 10/1095
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G06Q 30/0631
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G06Q 10/06315
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...
Patent abstract

Methods and apparatuses are provided for use in monitoring product placement within a shopping facility. Some embodiments provide an apparatus configured to determine product placement conditions within a shopping facility, comprising: a transceiver configured to wirelessly receive communications; a product monitoring control circuit coupled with the transceiver; a memory coupled with the control circuit and storing computer instructions that when executed by the control circuit cause the control circuit to: obtain a composite three-dimensional (3D) scan mapping corresponding to at least a select area of the shopping facility and based on a series of 3D scan data; evaluate the 3D scan mapping to identify multiple product depth distances; and identify, from the evaluation of the 3D scan mapping, when one or more of the multiple product depth distances is greater than a predefined depth distance threshold from the reference offset distance of the product support structure.

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