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US Patent 12119341 Electrostatic discharge diode having dielectric isolation layer

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
121193410
Patent Inventor Names
Miaomiao Wang0
Jingyun Zhang0
Heng Wu0
Julien Frougier0
Lan Yu0
Veeraraghavan S. Basker0
Huimei Zhou0
Xuefeng Liu0
Date of Patent
October 15, 2024
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Patent Application Number
174859610
Date Filed
September 27, 2021
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Patent Citations
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US Patent 9006087 Diode structure and method for wire-last nanomesh technologies
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US Patent 9012997 Semiconductor device including ESD protection device
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US Patent 9401355 Semiconductor device including a diode arranged in a trench
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US Patent 9431388 Series-connected nanowire structures
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US Patent 9761707 Laterally diffused MOSFET with isolation region
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US Patent 9847391 Stacked nanosheet field-effect transistor with diode isolation
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US Patent 11069784 Semiconductor device and method of manufacture
0
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US Patent 10504890 High density nanosheet diodes
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Patent Primary Examiner
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Mohammed Shamsuzzaman
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CPC Code
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H01L 29/78618
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H01L 29/78696
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H01L 29/66356
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H01L 29/66439
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H01L 29/7391
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H01L 29/0673
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H01L 29/775
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H01L 29/66545
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Patent abstract

In one embodiment a semiconductor structure comprises a semiconductor substrate, a trench dielectric layer disposed in a trench of the semiconductor substrate, a first source/drain region disposed in contact with the semiconductor substrate, a gate and a second source/drain region. The gate is disposed between the first source/drain region and the second source/drain region. The semiconductor structure further comprises a dielectric isolation layer disposed between the semiconductor substrate and the second source/drain region.

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