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US Patent 12069850 Semiconductor structure, manufacturing method thereof, and memory having bit line conducting layers covering the bit line contact layer and the insulating layer

Patent 12069850 was granted and assigned to ChangXin Memory Technologies on August, 2024 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
ChangXin Memory Technologies
ChangXin Memory Technologies
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Current Assignee
ChangXin Memory Technologies
ChangXin Memory Technologies
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
120698500
Patent Inventor Names
Chih-Cheng Liu0
Date of Patent
August 20, 2024
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Patent Application Number
175230840
Date Filed
November 10, 2021
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Patent Citations
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US Patent 9570391 Semiconductor device and method for manufacturing the same
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US Patent 7595262 Manufacturing method for an integrated semiconductor structure
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US Patent 9034745 Semiconductor device and method for manufacturing the same
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Patent Primary Examiner
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Hoai V Pham
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Patent abstract

A semiconductor structure and a manufacturing method thereof are provided. The semiconductor structure includes a substrate, in which a plurality of active areas arranged in an array are provided; buried word lines located in the substrate, in which each of the active areas intersects with two of the buried word lines; grooves located in an upper surface of the substrate, in which each of the grooves is located between two of the buried word lines in each of the active areas; bit line contact layers filling the grooves; insulating layers distributed between two of the grooves, in which a thickness between upper surfaces of the insulating layers and the upper surface of the substrate is smaller than a thickness between upper surfaces of the bit line contact layers and the upper surface of the substrate; and bit line conducting layers, covering the bit line contact layers and the insulating layers.

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